Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ken Latzko"'
Autor:
Christopher Safranski, Guohan Hu, Jonathan Z. Sun, Pouya Hashemi, Stephen L. Brown, Luxherta Buzi, Christopher P. D'Emic, Eric R. J. Edwards, Eileen Galligan, Matthias G. Gottwald, Oki Gunawan, Saba Karimeddiny, Hyunsung Jung, Juhyun Kim, Ken Latzko, Philip L. Trouilloud, Daniel C. Worledge
Publikováno v:
IEEE Transactions on Electron Devices. 69:7180-7183
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cf50b590f58f5adbd8a994a441d7886
https://doi.org/10.1109/ted.2022.3214168
https://doi.org/10.1109/ted.2022.3214168
Autor:
Bucknell C. Webb, Agno Marlon, Steven L. Wright, Katsuyuki Sakuma, Jiamin Ni, Ken Latzko, Xiao Hu Liu, John U. Knickerbocker, James A. Tornello, Stephen W. Bedell, Paul A. Lauro, Huan Hu
Publikováno v:
IEEE Sensors Journal. 19:7868-7874
Wearable sensors can provide important human physiology and activity data and therefore have promising applications in healthcare, entertainment, and security. Here, we report the design, fabrication, and characterizations of a thin silicon film sens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::610bd2c7a4332a5d4401129304031fa0
https://doi.org/10.1109/jsen.2019.2917278
https://doi.org/10.1109/jsen.2019.2917278
Autor:
John U. Knickerbocker, Agno Marlon, Huan Hu, Stephen W. Bedell, Steven L. Wright, Katsuyuki Sakuma, Bucknell C. Webb, Ken Latzko
Publikováno v:
2018 International Flexible Electronics Technology Conference (IFETC).
In this research study, we present comprehensive characterizations of flexible silicon sensors fabricated using controlled spalling which uses fracture to produce thin films of single-crystal silicon directly from a bulk substrate. We characterized t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2396ee4b753e792ef2bee5faefc0a1e0
https://doi.org/10.1109/ifetc.2018.8583971
https://doi.org/10.1109/ifetc.2018.8583971
Autor:
Sakuma, Katsuyuki, Hu, Huan, Liu, Xiao Hu, Ni, Jiamin, Bedell, Stephen W., Webb, Bucknell, Wright, Steven L., Lauro, Paul, Latzko, Ken, Agno, Marlon, Tornello, James, Knickerbocker, John U.
Publikováno v:
IEEE Sensors Journal; 9/15/2019, Vol. 19 Issue 18, p7868-7874, 7p