Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Kelly W. Stanford"'
Autor:
Patrick Gevargiz, Leif Scheick, Aaron J. Kenna, Jason L. Thomas, Amanda N. Bozovich, S.S. McClure, Stephanie A. Zajac, Duc N. Nguyen, Joe Davila, Bernard G. Rax, Mitch J. Sundgaard, Kelly W. Stanford
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8aba8a89d15ac9ad2a396876fe6c7da
https://doi.org/10.1109/redw51883.2020.9325858
https://doi.org/10.1109/redw51883.2020.9325858
Autor:
Amanda N. Bozovich, Bernard G. Rax, Joe Davila, Duc Nguyen, Aaron J. Kenna, Stephanie A. Zajac, Steven S. McClure, Jason L. Thomas, Leif Z. Scheick, Kelly W. Stanford, Patrick Gevargiz, Mitch J. Sundgaard
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df1d4f6b5b647cb00290cf84111b56b0
https://doi.org/10.1109/nsrec.2018.8584267
https://doi.org/10.1109/nsrec.2018.8584267
Autor:
Farokh Irom, Sergeh Vartanian, Leif Scheick, Gregory R. Allen, Larry D. Edmonds, S.S. McClure, Duc N. Nguyen, Kelly W. Stanford
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
We present total ionizing dose (TID) measurements of a commercial Samsung NAND flash memory intended for use on a high dose mission. Statistical variation in the first measurements necessitates a second set of measurements with an increased sample se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa3fa829c27193a529738e90abc8fd86
https://doi.org/10.1109/nsrec.2018.8584288
https://doi.org/10.1109/nsrec.2018.8584288