Zobrazeno 1 - 10
of 114
pro vyhledávání: '"Keller, Robert R."'
Publikováno v:
In Ultramicroscopy December 2020 219
Autor:
Miller, David L., Keller, Mark W., Shaw, Justin M., Rice, Katherine P., Keller, Robert R., Diederichsen, Kyle M.
Single crystal metal films on insulating substrates are attractive for microelectronics and other applications, but they are difficult to achieve on macroscopic length scales. The conventional approach to obtaining such films is epitaxial growth at h
Externí odkaz:
http://arxiv.org/abs/1305.5218
Publikováno v:
In Carbon August 2019 149:400-406
Publikováno v:
In Ultramicroscopy January 2019 196:40-48
Publikováno v:
J. Appl. Phys. vol. 112, p. 064317 (2012)
Films of (111)-textured Cu, Ni, and Cu$_x$Ni$_y$ were evaluated as substrates for chemical vapor deposition of graphene. A metal thickness of 400 nm to 700 nm was sputtered onto a substrate of $\alpha-$Al$_2$O$_3$(0001) at temperatures of 250 C to 65
Externí odkaz:
http://arxiv.org/abs/1205.0833
Publikováno v:
In Micron April 2017 95:42-50
Autor:
Holm, Jason, Keller, Robert R.
Publikováno v:
In Ultramicroscopy August 2016 167:43-56
Publikováno v:
In Microelectronic Engineering April 2012 92:111-114
Publikováno v:
The Journal of Experimental Education, 2011 Jan 01. 79(1), 30-52.
Externí odkaz:
http://www.jstor.org/stable/43820976
Autor:
Keller, Robert R.
Publikováno v:
Doctoral Dissertations Available from Proquest.
The need to compare students across different test administrations, or perhaps across different test forms within the same administration, plays a key role in most large-scale testing programs. In order to do this, these tests must be placed on the s
Externí odkaz:
https://scholarworks.umass.edu/dissertations/AAI3290053