Zobrazeno 1 - 10
of 166
pro vyhledávání: '"Keith R. Evans"'
Autor:
Lisa M. Porter, Keith R. Evans, R. J. Kamaladasa, Robert F. Davis, Edward A. Preble, Yoosuf N. Picard, Li Huang, Fang Liu, Tanya Paskova
Publikováno v:
Journal of Crystal Growth. 387:16-22
Systematic site-specific comparisons of the densities of threading dislocations (TDs) and associated V-defects in six-period In x Ga 1− x N/GaN multi-quantum wells (MQWs) with In mole fractions of x =0.1 and 0.2 have been conducted using several el
Autor:
Steven C. Binari, Edward A. Preble, Keith R. Evans, Tanja Paskova, D. S. Katzer, David J. Meyer, Theodosia Gougousi, David F. Storm, David J. Smith, David A. Deen
Publikováno v:
Journal of Crystal Growth. 380:14-17
We report the structural and electrical properties of ultrathin-barrier AlN/GaN heterostructures grown on freestanding GaN substrates by rf plasma-assisted molecular beam epitaxy. Structures with barrier thicknesses between 1.5 nm and 7.5 nm were gro
Autor:
R. J. Kamaladasa, Jingxi Zhu, Fang Liu, Li Huang, Lisa M. Porter, Robert F. Davis, Keith R. Evans, Yoosuf N. Picard, Tanya Paskova, Edward A. Preble
Publikováno v:
Journal of Crystal Growth. 347:88-94
An organometallic vapor phase epitaxy-based process route has been developed to achieve homoepitaxial deposition of GaN(0001) films via step-flow growth on substrates having
Autor:
Jing Zhang, Xiaohang Li, Hongping Zhao, Keith R. Evans, Nelson Tansu, Guangyu Liu, G. S. Huang, Tanya Paskova
Publikováno v:
Journal of Crystal Growth. 340:66-73
The epitaxy optimization studies of high-quality n-type AlInN alloys with different indium contents grown on two types of substrates by metalorganic vapor phase epitaxy (MOVPE) were carried out. The effect of growth pressure and V/III molar ratio on
Autor:
J. A. Grenko, Te Yuan Chung, Edward A. Preble, Mark Johnson, Keith R. Evans, Virginia D. Wheeler, Tanja Paskova, K. Udwary, K. Y. Lai
Publikováno v:
physica status solidi (a). 209:559-564
Phone: (þ886) 3-4227151 ext: 25256, Fax: (þ886) 3-4252897InGaN/GaN quantum wells (QWs) grown at identical con-ditions on m-plane GaN and c-plane sapphire substrates werecharacterized by several techniques, aiming to clarify thereason for different
Autor:
Fan Zhang, Ümit Özgür, S. Liu, Keith R. Evans, H. Y. Liu, Hadis Morkoç, Tanja Paskova, V. Avrutin, G. Mulholland, Xing Li, Xianfeng Ni, J. Lee
Publikováno v:
physica status solidi c. 8:1560-1563
Autor:
David J. Meyer, Edward A. Preble, Keith R. Evans, David F. Storm, Tanja Paskova, J.A. Roussos, D. S. Katzer, David A. Deen, Steven C. Binari, Robert Bass
Publikováno v:
Solid-State Electronics. 54:1470-1473
AlGaN/GaN/Be:GaN heterostructures have been grown by rf-plasma molecular beam epitaxy on freestanding semi-insulating GaN substrates, employing unintentionally-doped (UID) GaN buffer layers with thicknesses, d(sub UID), varying between 50 nm and 500
Autor:
Keith R. Evans, Edward A. Preble, Ümit Özgür, Mingzhong Wu, Hadis Morkoç, Jinqiao Xie, Xiaohang Li, Jacob H. Leach, Chang-Zhi Lu, Seydi Doğan, Xianfeng Ni, Tanja Paskova
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:908-911
InAlN/GaN heterostructure field-effect transistors (HFETs) have been grown and fabricated on Fe-doped semi-insulating c-plane GaN substrates. The problematic parasitic leakage caused by interface charge between the epitaxial layers and the GaN substr
Publikováno v:
Journal of Crystal Growth. 312:1205-1209
Systematic study of optical properties of undoped and Fe-doped substrates grown by hydride vapor phase epitaxy has revealed a strong dependence of the photoluminescence, transmission, reflectivity and ellipsometric spectra on the Fe-doping level. The
Autor:
C. W. Ebert, C. L. Reynolds, Keith R. Evans, Tanja Paskova, J. A. Grenko, Simon E. Lappi, Edward A. Preble, Mark Johnson, D.W. Barlage
Publikováno v:
Journal of Electronic Materials. 39:504-516
We report on the growth of Al0.25Ga0.75N/GaN heterostructures grown on low dislocation density vicinal surfaces of semi-insulating c-axis GaN substrates. Atomic force microscopy (AFM), photoluminescence (PL), cathodoluminescence (CL), high-resolution