Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Keith Harber"'
Publikováno v:
EDFA Technical Articles. 11:30-34
This article presents a case study involving flash memory bit failures characterized by threshold voltage changes due to positive gate disturb stress. An inconsistency in failing bit behavior, which was found to be dependent on the test mode, was exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba43fb127de2f508d92c170d3bedc5ad
https://doi.org/10.31399/asm.edfa.2009-2.p030
https://doi.org/10.31399/asm.edfa.2009-2.p030
Publikováno v:
EDFA Technical Articles. 10:20-28
Localizing defects in one-of-a-kind failures can take days, weeks, or even months, after which a detailed physical analysis is conducted to determine the root cause. TEM and STEM play complimentary roles in this process; TEM because of its superior s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6decb320db032ce1191462ebb8a1fe85
https://doi.org/10.31399/asm.edfa.2008-2.p020
https://doi.org/10.31399/asm.edfa.2008-2.p020
Autor:
Steve Brockett, Keith Harber
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper outlines the failure analysis of a Radio Frequency only (RF-only) failure on a complex Multimode Multiband Power Amplifier (MMPA) module, where slightly lower gain was observed in one mode of operation. 2 port S-parameter information was c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12b10822f7fa5170f226930a83bf4f3c
https://doi.org/10.31399/asm.cp.istfa2013p0095
https://doi.org/10.31399/asm.cp.istfa2013p0095
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper outlines the analysis of a flash single bit failure caused by bitcell degradation over write/erase cycling. With no physical anomaly present at the failing single bit, Atomic Force Probing (AFP) characterization was utilized in conjunction
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a0243fb0c115c1aa17696e24bd9227d
https://doi.org/10.31399/asm.cp.istfa2011p0207
https://doi.org/10.31399/asm.cp.istfa2011p0207