Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Keisuke Fujito"'
Autor:
Keisuke Fujito, Junzo Tanaka, Ji Won Moon, Takanori Kiguchi, Tomohiko Yoshioka, Kazuo Shinozaki, Naohiko Iimori, Naoki Wakiya
Publikováno v:
Materials Science and Engineering: B. 148:22-25
The effect of SrTiO 3 seed layer thickness on low-temperature crystallization and electrical properties Pb(Zr, Ti)O 3 (PZT) films by metalorganic chemical vapor deposition (MOCVD) were investigated. The thicknesses of SrTiO 3 seeds were varied with 1
Publikováno v:
Key Engineerig Materials. 320:65-68
Changes of residual stress and electrical properties were examined in (001)-oriented and (111)-oriented Pb(Zr0.5Ti0.5)O3 (PZT) thin films deposited on a buffered-Si substrate with a buffer and bottom electrode layer of a (La,Sr)CoO3(LSCO). A (001)-ep
Publikováno v:
Jpn. J. Appl. Phys.. 44(9B):6900-6904
Lead zirconate titanate (PZT) thin films were grown on a Si substrate with an epitaxial relationship by introducing yttria-stabilized zirconia (YSZ), CeO2, and (La,Sr)CoO3 (LSCO) buffer layers. The buffer layers, which facilitated the growth of the e
Publikováno v:
Journal of the Ceramic Society of Japan. 110:421-427
Effects of Pb(Zr0.5Ti0.5)O3 (PZT) thickness on the residual stresses and the electrical properties of a PZT thin-film layer were discussed for the PZT/Pt/SrTiO3 or PZT/(La0.5Sr0.5)CoO3/SrTiO3 system. Bottom electrodes, i.e., Pt and (La, Sr)CoO3 (LSCO
Autor:
Nobuyasu Mizutani, Nava Setter, Anna Macková, Keisuke Fujito, Tomoaki Yamada, D. Noujni, Peter K. Petrov, Takanori Kiguchi, S. Denisov, Paul Muralt, Kazuo Shinozaki, Alexander K. Tagantsev, Jan Petzelt, V. O. Sherman
Publikováno v:
Physical Review Letter. 96:157602
The in-plane and out-of-plane ferroelectric instabilities in compressed (100)-epitaxial ${\mathrm{SrTiO}}_{3}$ films were examined by infrared reflection spectroscopy. The strongly stiffened in-plane soft mode frequency softened very slowly on coolin