Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Keiko Ogai"'
Autor:
Hiroyuki Matsuda, Hiroki Momono, László Tóth, Yu Masuda, Koichi Moriguchi, Keiko Ogai, Hiroshi Daimon
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 264:147313
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0f9202b56f2803fa319dbc8da0cf661
https://doi.org/10.1016/j.elspec.2023.147313
https://doi.org/10.1016/j.elspec.2023.147313
Autor:
Keiko Ogai, Hirotaka Fujita, Tomio Watanabe, Yoshihito Harada, Yutaka Yoshida, Kazuaki Matsumuro, Yuji Ino, Kazuo Hayakawa, Koichi Moriguchi, Kenichi Yukihira, Hiroyoshi Soejima
Publikováno v:
Journal of Crystal Growth. 468:489-492
A new set-up of “Mossbauer Spectroscopic Microscope (MSM)” is applied to study not only the diffusion of Fe in a single-crystalline Si, but also a correlation between Fe impurities and the lattice defects in a multi-crystalline (mc-) Si. In addit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64e0d47cc869f7b74a2016aae75c4919
https://doi.org/10.1016/j.jcrysgro.2016.12.109
https://doi.org/10.1016/j.jcrysgro.2016.12.109
Autor:
Takayoshi Tanji, Tadahiro Kawasaki, Tetsuji Kodama, Takashi Ikuta, Keiko Ogai, Takaomi Matsutani, Takafumi Ishida
Publikováno v:
Microscopy. 64:69-76
A novel technique for reconstructing the phase shifts of electron waves was applied to Cs-corrected scanning transmission electron microscopy (STEM). To realize this method, a new STEM system equipped with an annular aperture, annularly arrayed detec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d2c052134e8d3b01193ab70d154bf0a3
https://doi.org/10.1093/jmicro/dfu098
https://doi.org/10.1093/jmicro/dfu098
Autor:
Kazuaki Matsumuro, Hirotaka Fujita, Kenichi Yukihira, Keiko Ogai, Tomio Watanabe, Hiroyoshi Soejima, Yuji Ino, Y. Harada, Koichi Moriguchi, Kazuo Hayakawa, Yutaka Yoshida
Publikováno v:
Hyperfine Interactions. 237
A prototype Mossbauer Spectroscopic Microscope is applied for the feasibility study of 57Fe impurity diffusion in Si wafers. A 2nm- 57Fe deposited Si wafer is annealed at 430 °C for 1 hour, and subsequently the 1/3 area of the wafer is further grind
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8af56e441c271ead1ff96deae93df239
https://doi.org/10.1007/s10751-016-1342-1
https://doi.org/10.1007/s10751-016-1342-1
Autor:
Hirotaka Fujita, Kazuo Hayakawa, Keiko Ogai, Tomio Watanabe, Yutaka Yoshida, Kenichi Yukihira, Yuji Ino, Koichi Moriguchi, Kiyotaka Tanaka, Hiroyoshi Soejima, Y. Harada
Publikováno v:
Hyperfine Interactions. 237
A 3D-Mossbauer Spectroscopic Microscope is developed to evaluate Fe impurities in multi-crystalline Si solar cells, which combines the Mossbauer spectroscopic microscope with a scanning electron microscope (SEM), an electron beam induced current (EBI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4eb48f9b52c64a26173e5d3bd08e018d
https://doi.org/10.1007/s10751-016-1255-z
https://doi.org/10.1007/s10751-016-1255-z
Publikováno v:
Surface Science. 493:138-142
Adsorbed protium and hydrogen have different adsorption energies on different adsorbates due to different chemical bonding states. A time-of-flight type electron-stimulated desorption (TOF-ESD) measures different types of chemical bonding states of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7d1f177b82e8d1beccde0d7953c29d1
https://doi.org/10.1016/s0039-6028(01)01201-8
https://doi.org/10.1016/s0039-6028(01)01201-8
Autor:
Keiko Ogai, Kazuyuki Ueda
Publikováno v:
Surface Science. 462:1-5
Mass and kinetic-energy differences of desorbed ions are separated simultaneously for the first time in a time-of-flight (TOF) spectrum for electron-stimulated desorption (ESD) spectroscopy. Taking into account the difference in the kinetic energy fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8541d884c3150774f2e599c11a7680a
https://doi.org/10.1016/s0039-6028(00)00611-7
https://doi.org/10.1016/s0039-6028(00)00611-7
Publikováno v:
Ultramicroscopy. 54:345-350
By using an electron interference microscope, we successfully observed a leakage microelectric field near the surface of the oxide superconducting material, YBa2Cu3O7 (Y123). Cooling down the specimen below Tc with a liquid helium specimen holder, it
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ddcc43f84a238daaa5a470f573d425f
https://doi.org/10.1016/0304-3991(94)90134-1
https://doi.org/10.1016/0304-3991(94)90134-1
Autor:
Kenji Umezawa, Hideaki Higashitsutsumi, Shigemitsu Nakanishi, Hiroki Nagasawa, Keiko Ogai, Hideki Hayashi, Eisuke Narihiro
Publikováno v:
MRS Proceedings. 1318
This study describes a low-energy atom scattering system that was combined with a time-of-flight spectrometer for insulator surface structural analysis. We show one example. MgO(001) crystal was used to study the surface analysis technique and is ill
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b7c0c17a1084bb61951dda8821da47e
https://doi.org/10.1557/opl.2011.918
https://doi.org/10.1557/opl.2011.918
2-D Chemical State Analysis of Adsorbed Hydrogen on Solid Surfaces Using Scanning ESD Ion Microscope
Autor:
Kazuyuki Ueda, Keiko Ogai
Publikováno v:
SHINKU. 44:284-286
Electron-stimulated desorption (ESD) measures adsorbed low-Z elements on solid surfaces. A TOF-ESD system reveals not only mass separation in the spectrum of desorbed ions but also kinetic energy distributions which reflect the chemical bonding energ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf17e10c2fabfb190ce35aed9cbe2614
https://doi.org/10.3131/jvsj.44.284
https://doi.org/10.3131/jvsj.44.284