Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Kefei Hei"'
Autor:
Kefei Hei, Guang Shi, Andreas Hansel, Zhongwen Deng, Sylwester Latkowski, Steven A. Van den Berg, Erwin Bente, Nandini Bhattacharya
Publikováno v:
IEEE Photonics Journal, Vol 11, Iss 6, Pp 1-10 (2019)
The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip sour
Externí odkaz:
https://doaj.org/article/46fa7469237f42e99c98aa8878a5d0b4
Autor:
Zhongwen Deng, A. Hänsel, Sylwester Latkowski, Kefei Hei, Steven A. van den Berg, Nandini Bhattacharya, Shi Guang, Erwin Bente
Publikováno v:
IEEE Photonics Journal, Vol 11, Iss 6, Pp 1-10 (2019)
IEEE Photonics Journal, 11(6)
IEEE Photonics Journal, 11(6):8827284. Institute of Electrical and Electronics Engineers
IEEE Photonics Journal, 11(6)
IEEE Photonics Journal, 11(6):8827284. Institute of Electrical and Electronics Engineers
The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip sour
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8262de6ef39309c34580da5bd54d0b48
https://ieeexplore.ieee.org/document/8827284/
https://ieeexplore.ieee.org/document/8827284/
Publikováno v:
Measurement Science and Technology, 31(4)
Distance measurement using frequency sweeping interferometry (FSI) is an absolute distance measurement technique that allows for high accuracy over long distances. Notwithstanding, the measurement accuracy is affected by laser sweeping nonlinearity a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e80fe2f233f7529a238164416fd2e7b1
http://resolver.tudelft.nl/uuid:f1df261f-fc1d-49cc-bd2d-31b82d86fb09
http://resolver.tudelft.nl/uuid:f1df261f-fc1d-49cc-bd2d-31b82d86fb09
Autor:
Nuria Sanchez, E Margallo, Kirill Zinoviev, Pasqualina M. Sarro, J. Rubio, Toshihiko Uto, Gregory Pandraud, Aleksandar Jovic, Kefei Hei, Juan Sancho
Publikováno v:
2018 IEEE Micro Electro Mechanical Systems, MEMS 2018, 2018-January
A highly miniaturized, single-chip, large scanning range MOEMS scanner is demonstrated. This intrinsically-aligned, monolithically integrated device uses small angular displacement to provide a linear scanning range of 2000 μm in the lateral and 100
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a53e17b99f3ada982d547a3ef023d64d
http://resolver.tudelft.nl/uuid:f8ffad40-f660-4c7b-ab8f-2c927072032f
http://resolver.tudelft.nl/uuid:f8ffad40-f660-4c7b-ab8f-2c927072032f
Publikováno v:
Measurement Science & Technology; Apr2020, Vol. 31 Issue 4, p1-1, 1p
Publikováno v:
Railway Standard Design; Jul2024, Vol. 68 Issue 7, p33-39, 7p
Autor:
Hei, Kefei, Shi, Guang, Hansel, Andreas, Deng, Zhongwen, Latkowski, Sylwester, Van den Berg, Steven A., Bente, Erwin, Bhattacharya, Nandini
Publikováno v:
IEEE Photonics Journal; Dec2019, Vol. 11 Issue 6, p1-10, 10p