Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Keenan Lang"'
Autor:
Peifan Liu, Paresh Pradhan, Antonino Miceli, Donald A. Walko, Deming Shu, Joseph Sullivan, Keenan Lang, Mark Rivers, Mario Balcazar, Kenan Li, Rachel Margraf, Aliaksei Halavanau, Anne Sakdinawat, Takahiro Sato, Diling Zhu, Yuri Shvyd’ko
Publikováno v:
Physical Review Accelerators and Beams, Vol 27, Iss 11, p 110701 (2024)
The success of x-ray free-electron lasers (XFELs) in recent years has greatly advanced many scientific fields. However, most of these XFELs suffer from a low longitudinal coherence and instabilities due to the stochastic start-up process. A cavity-ba
Externí odkaz:
https://doaj.org/article/dbb24594ab714477afffefc91130beca
Autor:
Barry Lai, Maoyu Wang, Stefan Vogt, Zhonghou Cai, Curt Preissner, Michael Wojcik, Keenan Lang, Sheikh T. Mashrafi, Junjing Deng, Max Wyman, Jeffrey A. Klug, Christian Roehrig, Zhenxing Feng
Publikováno v:
Microscopy and Microanalysis. 24:54-55
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::afaf7da999bc6ed63dde0f55179c15b8
https://doi.org/10.1017/s1431927618012692
https://doi.org/10.1017/s1431927618012692
Autor:
Pete R. Jemian, Ronald L. Sluiter, Lahsen Assoufid, Mark L. Rivers, Joe H. Sullivan, Jun Qian, Keenan Lang, Kurt Goetze, Tim Mooney
Publikováno v:
Advances in Metrology for X-Ray and EUV Optics VI.
The motion control, data acquisition and analysis system for APS Slope Measuring Profiler was implemented using the Experimental Physics and Industrial Control System (EPICS). EPICS was designed as a framework with software tools and applications tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57c3c15eda758b3c87e40d0de8f9cd28
https://doi.org/10.1117/12.2240118
https://doi.org/10.1117/12.2240118
Autor:
Michael Wojcik, Xianbo Shi, Ruqing Xu, Shashidhara Marathe, Erika Benda, Lahsen Assoufid, Wenjun Liu, Keenan Lang, Albert T. Macrander, Jon Tischler
Publikováno v:
The Review of scientific instruments. 87(5)
We developed a portable X-ray grating interferometer setup as a standard tool for testing optics at the Advanced Photon Source (APS) beamline 1-BM. The interferometer can be operated in phase-stepping, Moire, or single-grating harmonic imaging mode w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef8043136f84bc402e94af68d73ca9b5
https://pubmed.ncbi.nlm.nih.gov/27250384
https://pubmed.ncbi.nlm.nih.gov/27250384
Autor:
Keenan Lang, John Hammonds, Stanislav Stoupin, Zunping Liu, Elina Kasman, Lahsen Assoufid, Michael Wieczorek, Xianrong Huang, Albert T. Macrander, Yuri Shvyd'ko, Emil Trakhtenberg
Publikováno v:
AIP Conference Proceedings.
We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a71223208f885e4df6ea5586659a14bb
https://doi.org/10.1063/1.4952940
https://doi.org/10.1063/1.4952940
Autor:
Zunping Liu, Albert T. Macrander, Emil Trakhtenberg, Joe H. Sullivan, Michael Dudley, Keenan Lang, Kurt Goetze, Stanislav Stoupin, Balaji Raghothamachar
Publikováno v:
AIP Conference Proceedings.
Projection X-ray topography of single crystals is a classic technique for the evaluation of intrinsic crystal quality of large crystals. In this technique a crystal sample and an area detector (e.g., X-ray film) collecting intensity of a chosen cryst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc49eba41b310baa549eec00068cb17c
https://doi.org/10.1063/1.4952938
https://doi.org/10.1063/1.4952938
Autor:
Assoufid, Lahsen, Xianbo Shi, Marathe, Shashidhara, Benda, Erika, Wojcik, Michael J., Keenan Lang, Ruqing Xu, Wenjun Liu, Macrander, Albert T., Tischler, Jon Z.
Publikováno v:
Review of Scientific Instruments; May2016, Vol. 87 Issue 5, p052004-1-052004-5, 5p, 1 Diagram, 1 Chart, 3 Graphs