Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Kazutaka Taniguchi"'
Autor:
Kenji Yoshitani, Soshiro Ogata, Shinya Kato, Akito Tsukinaga, Tsunenori Takatani, Nobuhide Kin, Mariko Ezaka, Jun Shimizu, Yuko Furuichi, Shoichi Uezono, Kotaro Kida, Katsuhiro Seo, Shinichi Kakumoto, Hiroshi Miyawaki, Mikito Kawamata, Satoshi Tanaka, Manabu Kakinohana, Shunsuke Izumi, Hiroyuki Uchino, Takayasu Kakinuma, Kimitoshi Nishiwaki, Kazuko Hasegawa, Mishiya Matsumoto, Kazuyoshi Ishida, Atsuo Yamashita, Michiaki Yamakage, Yusuke Yoshikawa, Yuji Morimoto, Hitoshi Saito, Takahisa Goto, Tetsuhito Masubuchi, Masahiko Kawaguchi, Kosuke Tsubaki, Satoshi Mizobuchi, Norihiko Obata, Yoshimi Inagaki, Kazumi Funaki, Yoshiki Ishiguro, Masamitsu Sanui, Kazutaka Taniguchi, Kunihiro Nishimura, Yoshihiko Ohnishi
Publikováno v:
Journal of Anesthesia. 37:408-415
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82f47d31307178e30b148c12de04adb9
https://doi.org/10.1007/s00540-023-03179-3
https://doi.org/10.1007/s00540-023-03179-3
Publikováno v:
Pattern Recognition. 39:1044-1052
A method to detect mura, which is defined as an irregular lightness variation on a uniformly manufactured surface, is necessary to maintain the quality of the display devices. The mura is understood as defects without a clear contour or a contrast wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfedd787c2d78b6b0f0df0f00e2d4dc5
https://doi.org/10.1016/j.patcog.2005.07.007
https://doi.org/10.1016/j.patcog.2005.07.007
Publikováno v:
IEEJ Transactions on Industry Applications. 126:1539-1548
A method to detect MURA, which is defined as irregular lightness variation on uniformly manufactured surface, is necessary to keep quality of the display devices. The MURA is inevitable matter for devices relating to image processing. Input devices,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62defb045adeca4e73fd52328b5f2921
https://doi.org/10.1541/ieejias.126.1539
https://doi.org/10.1541/ieejias.126.1539
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 76:105-116
This paper proposes a Bi-CMOS current-mode multivalued logic circuit enabling high-accuracy computation, high-speed computation, and high integration. In conventional current-mode multivalued logic circuits using I2L and CMOS configurations, the real
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::069bada48990dc620f06bdcb503cbc72
https://doi.org/10.1002/ecjb.4420760312
https://doi.org/10.1002/ecjb.4420760312
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 73:107-114
This paper presents the design of CMOS multiple-valued logic circuits using only one voltage source. The circuits designed by the proposed method have only two lines for voltage sources compared with that of the conventional circuits which require ma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c493f908bb2f63912c8d5874ff8b7448
https://doi.org/10.1002/ecjb.4420730513
https://doi.org/10.1002/ecjb.4420730513
Publikováno v:
Eighth International Conference on Quality Control by Artificial Vision.
A mura quantification method in the mura inspection is reported. Mura is local unevenness of lightness in a uniformly manufactured surface without clear contour which gives viewers unpleasant sensation. The mura has been inspected by human inspectors
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a796c5a96775c8e3f7c9f61c536ff5be
https://doi.org/10.1117/12.736735
https://doi.org/10.1117/12.736735
Publikováno v:
Proceedings of the 44th IEEE Conference on Decision and Control.
Recently, Wang and Ray introduced a signed measure for formal languages, called a language measure, to evaluate performance of strings generated by discrete event systems and a synthesis method of an optimal supervisor based on the language measure h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a48f418133e488dd32dec5eb2377780
https://doi.org/10.1109/cdc.2005.1582142
https://doi.org/10.1109/cdc.2005.1582142
Publikováno v:
SMC
Here, we describe a method to detect mura during the display devices manufacturing process on a uniformly coated thin photoresist layer. A mura is an irregular variation of lightness on a uniformly manufactured surface. Display devices are manufactur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::591d2c8ff3056621914ce8a2e1520be3
https://doi.org/10.1109/icsmc.2006.385108
https://doi.org/10.1109/icsmc.2006.385108
Publikováno v:
SMC (7)
A method to detect mura, which is defined as irregular lightness variation on uniformly manufactured surface, is necessary to keep quality of the display devices. The mura is understood as defects without clear contour or contrast which gives viewers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7708b302c91c771dde7dd5591e55c464
https://doi.org/10.1109/icsmc.2004.1401406
https://doi.org/10.1109/icsmc.2004.1401406