Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Kazushi Yoshimura"'
Publikováno v:
Journal of Information Display. 10:202-205
An automated circuit repair system was developed for enhancing the yield of nondefective liquid crystal panels, focusing on the resist patterns on the circuit material layer of thin‐film transistor (TFT) substrates prior to etching. The developed s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db41e41102045e698f7168b44a45d851
https://doi.org/10.1080/15980316.2009.9652108
https://doi.org/10.1080/15980316.2009.9652108
Publikováno v:
ECS Transactions. 8:267-272
We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of Thin Film Transistor substrates for liquid crystal displays. The method focuses on correcting resist patterns after the developm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14d14bf309b197276dafc5b34bdf4fc2
https://doi.org/10.1149/1.2767319
https://doi.org/10.1149/1.2767319
Publikováno v:
Journal of the Japan Landslide Society. 41:49-56
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be2168bc91ce74d3e49ddcb0c6573856
https://doi.org/10.3313/jls.41.49
https://doi.org/10.3313/jls.41.49
Autor:
Takashi Hiroi, Hideaki Sasaki, Toshimitsu Hamada, Kazushi Yoshimura, Shigeki Mio, Takanori Ninomiya, Nakagawa Yasuo
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 112:125-134
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62e428a96402ccf40fd43449f9215d4d
https://doi.org/10.1541/ieejeiss1987.112.2_125
https://doi.org/10.1541/ieejeiss1987.112.2_125
Publikováno v:
ICPR (1)
Describes a new automatic pattern inspection method which can reliably detect fatal circuit defects without giving false alarms due to circuit patterns with slightly jagged edges. Also described is a high-speed automatic inspection system for screen-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::743174dbc5f43fe2e9b22b9ddc1b8298
https://doi.org/10.1109/icpr.1992.201506
https://doi.org/10.1109/icpr.1992.201506
Autor:
Yukio Sugawara, Kazushi Yoshimura
Publikováno v:
The Proceedings of Conference of Hokkaido Branch. :163-164
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8facdbe1886d22356703278ec519691b
https://doi.org/10.1299/jsmehokkaido.2012.51.163
https://doi.org/10.1299/jsmehokkaido.2012.51.163
Publikováno v:
Applied Optics. 45:2643
We have developed a new photodisplacement microscope system for practical use that achieves high-sensitivity simultaneous real-time imaging of surface and subsurface structures from a single space-frequency multiplexed interferogram. In this system a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a09a05faa93bd8186ecee6e18cac47ab
https://doi.org/10.1364/ao.45.002643
https://doi.org/10.1364/ao.45.002643
Publikováno v:
SPIE Proceedings.
We have developed pattern inspection techniques for Integrated Circuit elements which use an SEMI (Scanning Electron Microscope). In this paper we will discuss the transformation of low SP1 ratio SEM image signals into binary values, detection techni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e57ffe9921171621517addc6bfb227c3
https://doi.org/10.1117/12.936682
https://doi.org/10.1117/12.936682
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