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pro vyhledávání: '"Kazuo Shinke"'
Autor:
Hiroki Taniguchi, Teruo Suzuki, Kazuya Okubo, Osamu Mihama, Hiroyuki Okumura, Kazuo Shinke, Masanori Sawada
Publikováno v:
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
Resolving frequent ESD failures at an assembly house was time-consuming. Testing CDM robustness in the wafer/bare die state would provide early information about problems with semiconductor design or electrostatic controls. With our new JS-002-compli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c2840841372bc8c113095bc8d9711a0
https://doi.org/10.23919/eos/esd.2019.8869985
https://doi.org/10.23919/eos/esd.2019.8869985
