Zobrazeno 1 - 10
of 202
pro vyhledávání: '"Kazuo Morigaki"'
Publikováno v:
Philosophical Magazine Letters. 96:183-188
The decay of the peak intensity of the electron spin resonance signal associated with light-induced dangling bonds in a-Si(H) has been measured at room temperature as a function of time during very long intervals such as 3400 days after the intense p
Autor:
Kazuo Morigaki
Publikováno v:
The European Physical Journal Applied Physics. 90:20101
We have proposed a model of light-induced defect creation processes and light-induced defects. Recently, important results using pulsed electron-nuclear double resonance (ENDOR) by Fehr et al. [M. Fehr, A. Schnegg, C. Teutloff, R. Bittl, O. Astakhov,
Publikováno v:
Canadian Journal of Physics. 92:561-564
Recombination rates at radiative defects in the hydrogenated amorphous silicon films prepared at various preparation conditions, estimated from intensities and characteristic lifetimes of defect photoluminescence, have been investigated. The temperat
Amorphous semiconductors are subtances in the amorphous solid state that have the properties of a semiconductor and which are either covalent or tetrahedrally bonded amorphous semiconductors or chelcogenide glasses. Developed from both a theoretical
This book covers electronic and structural properties of light-induced defects, light-induced defect creation processes, and related phenomena in crystalline, amorphous, and microcrystalline semiconductors. It provides a theoretical treatment of reco
Autor:
Kazuo Morigaki, C. Ogihara
Publikováno v:
physica status solidi c. 9:2574-2577
Temperature variation of the recombination rates has been investigated for the electron-hole pairs responsible for defect PL in a defective a-Si:H film as grown. The results are compared with those obtained for a high-quality a-Si:H film after illumi
Autor:
Kazuo Morigaki, H. Hikita
Publikováno v:
physica status solidi c. 8:2564-2568
Stretched exponential relaxation has been observed in various phenomena of hydrogenated amorphous silicon (a-Si:H) and hydrogenated polymorphous silicon (pm-Si:H). As an example, we take light-induced defect creation in a-Si:H and pm-Si:H, in which d
Publikováno v:
physica status solidi c. 8:2792-2795
Temperature variation of radiative recombination rate obtained for defect photoluminescence (PL) in high-quality a-Si:H after illumination of intense pulsed light is presented and compared with results previously reported for defective a-Si:H films.
Autor:
C. Ogihara, Kazuo Morigaki
Publikováno v:
physica status solidi c. 7:662-665
Temperature variations of radiative recombination rates of electron-hole pairs responsible for photoluminescence in a-Si:H films have been analysed from the intensity, I, and the characteristic value of the lifetime, τ, obtained from frequency resol
Publikováno v:
Journal of Non-Crystalline Solids. 354:2131-2134
Our model for light-induced defect creation in hydrogenated amorphous silicon is applied to its kinetics, i.e., the growing curve of light-induced dangling bond density as a function of illumination time, which is fitted to a stretched exponential fu