Zobrazeno 1 - 10
of 318
pro vyhledávání: '"Kazuo Arai"'
Autor:
Kazuo Arai, Yohei Jinno, Tetsuo Ichikawa, Shuntaro Yamada, Ryo Jimbo, Yoshihito Naito, Silvia Galli
Publikováno v:
The International Journal of Periodontics & Restorative Dentistry. 39:259-264
This study investigated the level of magnetic energy around implants possessing a static magnetic field (SMF) and assessed the in vivo influence of SMF on bone regeneration. Implants possessing a sintered neodymium magnet internally were placed in a
Autor:
Takuma Suzuki, Toshiyuki Ohno, Takashi Tsuji, Kazuo Arai, Bin Chen, Tetsuo Hatakeyama, Yoshiyuki Yonezawa, Hirohumi Matsuhata, Hirotaka Yamaguchi, Takashi Sekiguchi, Masayuki Sasaki
Publikováno v:
Electrical Engineering in Japan. 197:3-17
SUMMARY Current 4H-SiC wafers contain certain amount of dislocations, stacking faults, and other lattice-defects. These defect structures evolve during various processes for power device fabrication. It is very important to examine evolutions of disl
Autor:
Masayuki Sasaki, Toshiyuki Ohno, Kazuo Arai, Takashi Tsuji, Hirofumi Matsuhata, Tetsuo Hatakeyama, Yoshiyuki Yonezawa, Takuma Suzuki, Takashi Sekiguchi, Bin Chen, Hirotaka Yamaguchi
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 135:768-779
Publikováno v:
Materials Science Forum. :899-902
3 kV normally-off SiC-buried gate static induction transistors (SiC-BGSITs) were fabricated by using an innovative fabrication process that was used by us previously to fabricate 0.7–1.2 kV SiC-BGSITs. The fabricated device shows the lowest specifi
Publikováno v:
Journal of Applied Physics; 9/1/2003, Vol. 94 Issue 5, p2942, 6p, 6 Graphs
Publikováno v:
Materials Science Forum. :962-965
We investigated the short-circuit capabilities of 1.2 kV normally-off SiC buried gate static induction transistors (SiC-BGSITs). The maximum short-circuit energy was found to be 35.6 J/cm2, which is twice that of normally-on SiC-BGSITs and 3.3–5.6
Publikováno v:
Materials Science Forum. :662-665
In this work, we succeeded in developing high performance normally-off SiC buried gate static induction transistors (SiC-BGSITs). To achieve the normally-off characteristics, design parameters around the channel region were optimized and process cond
Autor:
Tetsuya Ozawa, Hiroyoshi Taniguchi, Hajime Okumura, Ichiro Nagai, Tomohisa Kato, Hideaki Kawashima, Miura Tomonori, Kazuo Arai
Publikováno v:
Materials Science Forum. :3-7
In this study, we suggest the effective enlargement method of (0001) 4H-SiC bulk crystals grown by the sublimation method using long length growth technique (LLG). This method could achieve low thermal strain and rapid enlargement growth comparing wi
Publikováno v:
Materials Science Forum. :543-546
In this study, we investigated the cluster effect on the occurrence of giant step bunching. We generated carbon clusters on 4H-SiC (0001) surfaces by thermal decomposition of SiC in an Ar atmosphere and controlled the surface concentrations of the cl
Publikováno v:
Materials Science Forum. :535-538
We investigated the crystalline quality and electrical properties of the channel regions in 4H-SiC buried gate static induction transistors (SiC-BGSITs). To accurately determine the characteristics of the channel regions, we performed transmission el