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pro vyhledávání: '"Kazuhito Nakagawa"'
Autor:
Kazuhito Nakagawa, Tomohiko Hara, Takefumi Kamioka, Taichi Tanaka, Yuki Isogai, Yoshio Ohshita
Publikováno v:
Electronic Materials Letters. 17:399-405
Effect of lights with various wavelength on the defect generation in reactive plasma deposition (RPD) process is studied using capacitance–voltage analysis. Indium-tin oxide (ITO) deposition by RPD dramatically decreases the minority carrier lifeti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef058bdc98fe060a9d9e47cb43a244b9
https://doi.org/10.1007/s13391-021-00295-8
https://doi.org/10.1007/s13391-021-00295-8
