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Autor:
Mika Kambe, Makoto Fukawa, Satoshi Takeda, Naohiko Ishimaru, Michio Kondo, Kohjiro Hara, Kazuhiko Mitarai
Publikováno v:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
It is shown that Potential Induced Degradation (PID) can be prevented by using chemically strengthened glass as module cover glass in this paper. While several factors are considered to be the causes of PID, migration of Na ions from module cover gla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ae2145c5308f47e2e9ec5febe552687
https://doi.org/10.1109/pvsc.2013.6744441
https://doi.org/10.1109/pvsc.2013.6744441
