Nanomechanical and nanoelectromechanical phenomena in 2D-atomic crystals : a scanning probe microscopy approach

Autor: Kay, Nicholas D.

In this thesis we probe the morphological, nanomechanical and nanoelectromechanical properties of 2D materials: graphene, MoS2 and h-BN. Throughout this study we extensively use scanning probe techniques of ultrasonic force microscopy (UFM), direct-c

Externí odkaz: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.700841

Nanoscale Mapping of Nanosecond Time-scale Electro-Mechanical Phenomena in Graphene NEMS

Autor: Kay, Nicholas D., Tovee, Peter D., Robinson, Benjamin J., Novoselov, Konstantin S., Kolosov, Oleg V.

Atomically thin layers of two-dimensional (2D) materials such as graphene, MoS2 and h-BN have immense potential as sensors and electronic devices thanks to their highly desirable electronic, mechanical, optical and heat transport properties. In parti

Externí odkaz: http://arxiv.org/abs/1509.00804

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Subsurface imaging of two-dimensional materials at the nanoscale

Autor: Oleg Kolosov, Pasqualnthonio Pingue, Nicholas Kay, Franco Dinelli

Publikováno v: Nanotechnology (Bristol. Print) 28 (2017): 085706-1–085706-8. doi:10.1088/1361-6528/aa55e2
info:cnr-pdr/source/autori:Dinelli F.; Pingue P.; Kay N.D.; Kolosov O.V./titolo:Subsurface imaging of two-dimensional materials at the nanoscale/doi:10.1088%2F1361-6528%2Faa55e2/rivista:Nanotechnology (Bristol. Print)/anno:2017/pagina_da:085706-1/pagina_a:085706-8/intervallo_pagine:085706-1–085706-8/volume:28

Scanning probe microscopy (SPM) represents a powerful tool that, in the past 30 years, has allowed for the investigation of material surfaces in unprecedented ways at the nanoscale level. However, SPM has shown very little capability for depth penetr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64c9804e915d7ac3063b914aec792326
https://publications.cnr.it/doc/373010