Zobrazeno 1 - 10
of 95
pro vyhledávání: '"Kavei, G"'
Publikováno v:
Physica A 375 (2007) 239
The effect of etching time scale of glass surface on its statistical properties has been studied using atomic force microscopy technique. We have characterized the complexity of the height fluctuation of a etched surface by the stochastic parameters
Externí odkaz:
http://arxiv.org/abs/0704.1030
Autor:
Jafari, G. R., Fazeli, S. M., Ghasemi, F., Allaei, S. M. Vaez, Tabar, M. Reza Rahimi, zad, A. Iraji, Kavei, G.
Publikováno v:
Phys.Rev.Lett. 91 (2003) 226101
We investigate Markov property of rough surfaces. Using stochastic analysis we characterize the complexity of the surface roughness by means of a Fokker-Planck or Langevin equation. The obtained Langevin equation enables us to regenerate surfaces wit
Externí odkaz:
http://arxiv.org/abs/cond-mat/0312455
Publikováno v:
J. Phys.: Condens. Matter 15 (2003) 1889
The spatial scaling law and intermittency of the $V_2 O_5$ surface roughness by atomic force microscopy has been investigated. The intermittency of the height fluctuations has been checked by two different methods, first, by measuring scaling exponen
Externí odkaz:
http://arxiv.org/abs/cond-mat/0306035
Publikováno v:
In Materials Chemistry and Physics 2010 119(1):145-148
Autor:
Kavei, G., Gheidari, A. Mohammadi
Publikováno v:
In Journal of Materials Processing Tech. 2008 208(1):514-519
Publikováno v:
In Applied Surface Science 2005 252(2):466-473
Publikováno v:
Bulletin of Materials Science. 2011, Vol. 34 Issue 7, p1591-1597. 7p. 1 Black and White Photograph, 1 Chart, 3 Graphs.
Autor:
Kavei, G.1 g.kavei@merc.ac.ir, Karami, M. A.1
Publikováno v:
Bulletin of Materials Science. 2006, Vol. 29 Issue 7, p659-663. 5p.