Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

Autor: Thomas Michlmayr, Maksym Hennadiiovych Demydenko, C. G. H. Walker, Danilo Pescia, S.P. Tear, T. Bahler, Urs Ramsperger, Ann-Katrin Thamm, M.M. El Gomati, M Bodik, Andrew Pratt

Publikováno v: 2021 34th International Vacuum Nanoelectronics Conference (IVNC).

In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4ac72527fc481bab27347e3abddd0ef
https://doi.org/10.1109/ivnc52431.2021.9600768

Membrane-Based Scanning Force Microscopy

Autor: Marc-Dominik Krass, Martin Héritier, Alexander Eichler, Romana Schirhagl, Thomas Gisler, Letizia Catalini, Albert Schliesser, Eric C. Langman, Urs Grob, Hinrich Mattiat, David Hälg, Christian L. Degen, Ann-Katrin Thamm, Yeghishe Tsaturyan

Publikováno v: Physical Review Applied
Halg, D, Gisler, T, Tsaturyan, Y, Catalini, L, Grob, U, Krass, M-D, Heritier, M, Mattiat, H, Thamm, A-K, Schirhagl, R, Langman, E C, Schliesser, A, Degen, C L & Eichler, A 2021, ' Membrane-Based Scanning Force Microscopy ', Physical Review Applied, vol. 15, no. 2, 021001 . https://doi.org/10.1103/PhysRevApplied.15.L021001
Physical Review Applied, 15 (2)
Physical Review Applied, 15(2):L021001. AMER PHYSICAL SOC

We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98042a64d18469f34d03f411cb27d3a2
https://doi.org/10.1103/PhysRevApplied.15.L021001

Magnetic Analysis of Ultrathin Fe Films on W(011) with SFEMPA

Autor: Danilo Pescia, Ann-Katrin Thamm, Jiapeng Wei, Maksym Hennadiiovych Demydenko, Urs Ramsperger

Publikováno v: 2020 33rd International Vacuum Nanoelectronics Conference (IVNC)

An ultra-high vacuum Scanning Tunneling Microscope (STM) is converted into a lens-less low-energy Scanning Electron Microscope when the tip-target distance is some tens of nanometers and the tip acts as a source of field emitted electrons. This prima

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::acf6a4d7decce3437d3c36a8ed04e531
https://hdl.handle.net/20.500.11850/447650

Cover Feature: Symmetric Mixed Sulfur–Selenium Fused Ring Systems as Potential Materials for Organic Field‐Effect Transistors (Chem. Eur. J. 13/2020)

Autor: Christian Hametner, Johannes Fröhlich, Daniel Lumpi, Berthold Stöger, Barbara Dellago, Ann-Katrin Thamm, Brigitte Holzer, Ernst Horkel, Thomas Mathis, Bertram Batlogg

Publikováno v: Chemistry – A European Journal. 26:2764-2764

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::646513a70a0068ba46a58bafb103ff43
https://doi.org/10.1002/chem.202000230

Growth patterns during segmentation in the two polychaete annelids, Capitella sp. I and Hydroides elegans: comparisons at distinct life history stages

Autor: Elaine C. Seaver, Susan D. Hill, Katrin Thamm

Publikováno v: Evolution Development. 7:312-326

Summary Many animals generate new body segments sequentially from a posterior growth zone, and this is generally thought to be the case for the annelids. Most annelids, including polychaetes, have an indirect life cycle and generate their earliest se

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e7d03f8510b651069b915c66c8ef8635
https://doi.org/10.1111/j.1525-142x.2005.05037.x