Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Kato, Kunioki"'
Publikováno v:
Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy. 42(1):45-50
Atomic structures of SiO_x amorphous thin films of 200 nm thick were analyzed by the grazing incident x-ray scattering (GIXS) method. The radial distribution functions (RDFs) were experimentally determined in two SiO_x amorphous thin films grown in t
Publikováno v:
Bulletin of the Chemical Society of Japan; July 1968, Vol. 41 Issue: 7 p1694-1696, 3p