Zobrazeno 1 - 10
of 79
pro vyhledávání: '"Katnagallu, Shyam"'
Autor:
Kim, Se-Ho, Bhatt, Shalini, Schreiber, Daniel K., Neugebauer, Jörg, Freysoldt, Christoph, Gault, Baptiste, Katnagallu, Shyam
Field evaporation from ionic or covalently bonded materials often leads to the emission of molecular ions. The metastability of these molecular ions, particularly under the influence of the intense electrostatic field (1010 Vm-1), makes them prone to
Externí odkaz:
http://arxiv.org/abs/2401.12784
Autor:
Saxena, Alaukik, Polin, Nikita, Kusampudi, Navyanth, Katnagallu, Shyam, Molina-Luna, Leopoldo, Gutfleisch, Oliver, Berkels, Benjamin, Gault, Baptiste, Neugebauer, Jörg, Freysoldt, Christoph
Atom probe tomography (APT) is ideally suited to characterize and understand the interplay of chemical segregation and microstructure in modern multicomponent materials. Yet, the quantitative analysis typically relies on human expertise to define reg
Externí odkaz:
http://arxiv.org/abs/2304.08761
We present a computational approach to simulate local contrast observed in Field Ion Microscopy (FIM). It is based on density-functional theory utilizing the Tersoff-Hamann approach as done in Scanning Tunneling Microscopy (STM). A key requirement is
Externí odkaz:
http://arxiv.org/abs/2212.10910
Recording field ion microscope images under field evaporating conditions and subsequently reconstructing the underlying atomic configuration, called three-dimensional field ion microscopy (3D-FIM) is one of the few techniques capable of resolving cry
Externí odkaz:
http://arxiv.org/abs/2209.06533
Autor:
Katnagallu, Shyam, Morgado, Felipe Felipe F., Mouton, Isabelle, Gault, Baptiste, Stephenson, Leigh T.
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of attaining atom
Externí odkaz:
http://arxiv.org/abs/2103.11010
Autor:
Morgado, Felipe F., Katnagallu, Shyam, Freysoldt, Christoph, Klaes, Benjamin, Vurpillot, François, Neugebauer, Jörg, Raabe, Dierk, Neumeier, Steffen, Gault, Baptiste, Stephenson, Leigh T.
Imaging individual vacancies in solids and revealing their interactions with solute atoms remains one of the frontiers in microscopy and microanalysis. Here we study a creep-deformed binary Ni-2 at.% Ta alloy. Atom probe tomography reveals a random d
Externí odkaz:
http://arxiv.org/abs/2103.01639
Autor:
Klaes, Benjamin, Larde, Rodrigue, Delaroche, Fabien, Parviainen, Stefan, Rolland, Nicolas, Katnagallu, Shyam, Gault, Baptiste, Vurpillot, François
This article presents a numerical model dedicated to the simulation of field ion microscopy (FIM). FIM was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of the atoms from the
Externí odkaz:
http://arxiv.org/abs/1911.08352
Autor:
Katnagallu, Shyam, Stephenson, Leigh T., Mouton, Isabelle, Freysoldt, Christoph, Subramanyam, Aparna P. A., Jenke, Jan, Ladines, Alvin N., Neumeier, Steffen, Hammerschmidt, Thomas, Drautz, Ralf, Neugebauer, Jörg, Vurpillot, François, Raabe, Dierk, Gault, Baptiste
Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials' properties, remains a formidable challenge. Here, we propose a new approach to chemistry-sensitive field-ion microscopy (FIM)
Externí odkaz:
http://arxiv.org/abs/1903.03288
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Autor:
Katnagallu, Shyam, Gault, Baptiste, Grabowski, Blazej, Neugebauer, Jörg, Raabe, Dierk, Nematollahi, Ali
Field ion microscopy (FIM) allows to image individual surface atoms by exploiting the effect of an intense electric field. Widespread use of atomic resolution imaging by FIM has been hampered by a lack of efficient image processing/data extraction to
Externí odkaz:
http://arxiv.org/abs/1712.10245