Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Kathleen Coleman"'
Publikováno v:
Jiàoyù zīliào yǔ túshūguǎn xué, Vol 13, Iss 4, Pp 33-36,40 (1978)
無無
Externí odkaz:
https://doaj.org/article/dc986daf65bd49a387e0351a8176bc25
Autor:
Judy Shackelford, Wendy Zimmerman, Kathleen Coleman, Lorie Henley, Betsy A. Johnson, Laureen Donovan
Publikováno v:
Journal of Christian Nursing. 40:122-130
Autor:
Hao Pan, Zishen Tian, Megha Acharya, Xiaoxi Huang, Pravin Kavle, Hongrui Zhang, Liyan Wu, Dongfang Chen, John Carroll, Robert Scales, Cedric J. G. Meyers, Kathleen Coleman, Brendan Hanrahan, Jonathan E. Spanier, Lane W. Martin
Publikováno v:
Advanced Materials.
Publikováno v:
Journal of the European Ceramic Society. 41:2465-2471
Piezoelectric micromechanical systems (piezoMEMS) are often subjected to harsh mechanical and electrical loads during operation. This study evaluates the effects of the electrical history of a lead zirconate titanate (PZT) layer on the electro-mechan
Publikováno v:
Acta Materialia. 191:245-252
Piezoelectric thin films are vulnerable to fracture, which results in degradation of the structural integrity and device performance in piezoelectric microelectromechanical systems (PiezoMEMS). This work explains the fracture process as a combination
Autor:
Wanlin Zhu, Song Won Ko, Susan Trolier-McKinstry, Julian Walker, Kathleen Coleman, Peter Mardilovich
Publikováno v:
2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF).
Understanding the failure mechanisms of piezoelectric thin films is critical for the commercialization of piezoelectric microelectromechanical systems. This paper describes the failure of $0.6\ \mu \mathrm{m}$ lead zirconate titanate (PZT) thin films
Autor:
Runar Plunnecke Dahl-Hansen, Frode Tyholdt, Jonathan M. Polfus, Thomas Tybell, Kathleen Coleman, Lyndsey M. Denis, Betul Akkopru-Akgun, Susan Trolier-McKinstry, Einar Vøllestad
Publikováno v:
Journal of Applied Physics
The ambient humidity significantly accelerates the degradation of lead zirconate titanate (PZT) films in microelectromechanical systems; the cause of such degradation is under debate. Here, it is shown that the degradation of chemical solution derive
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1faeb459d7743c705a2cede77f732960
https://hdl.handle.net/11250/2994660
https://hdl.handle.net/11250/2994660
Autor:
Yiwen Song, Kathleen Coleman, Erica A. Douglas, Stefan C. Badescu, Baxter Moody, Sukwon Choi, Susan Trolier-McKinstry, Adam Edstrand, Elizabeth A. Moore, James Spencer Lundh, Jacob H. Leach, Benjamin A. Griffin, Giovanni Esteves
Publikováno v:
Journal of Applied Physics. 130:044501
In this study, the Raman biaxial stress coefficients KII and strain-free phonon frequencies ω0 have been determined for the E2 (low), E2 (high), and A1 (LO) phonon modes of aluminum nitride, AlN, using both experimental and theoretical approaches. T
Publikováno v:
MRS Advances. 1:3853-3858
The dynamic evolution and interaction of defects under the conditions of shock loading in nanocrystalline Al with an average grain size of 20 nm is investigated using molecular dynamics simulations for an impact velocity of 1 km/s. Four stages of def
Publikováno v:
Journal of Applied Physics. 128:114102
The character of extrinsic contributions to the dielectric and pyroelectric properties of Pb0.99[(Zr0.52Ti0.48)0.98Nb0.02]O3 (PZT) films on Ni foil and Si wafers was explored using Rayleigh analysis, third harmonic phase angle, and Preisach analysis