Zobrazeno 1 - 10
of 66
pro vyhledávání: '"Kasturi Ghosh"'
Autor:
Kasturi Ghosh
Publikováno v:
Journal of Circuits, Systems and Computers.
A power-efficient second-order no-capacitor feedforward (NCFF) op-amp has been designed in 180[Formula: see text]nm CMOS process. To attain high gain and better common mode rejection, cross-coupled loading network has been used in each differential s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7b3d87ff01914373062000f3fec6188
https://doi.org/10.1142/s0218126623502894
https://doi.org/10.1142/s0218126623502894
Publikováno v:
Integration. 84:92-101
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38a68f3f12cfbf39a43304819e698611
https://doi.org/10.1016/j.vlsi.2022.01.005
https://doi.org/10.1016/j.vlsi.2022.01.005
Publikováno v:
IETE Journal of Research. :1-11
Oscillation-based test algorithm has been proposed and verified experimentally as an alternative to the specification--based test of analog circuits. Active filters are transformed to oscillators u...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e16b2f1ffe6175de310a4689632ad4ec
https://doi.org/10.1080/03772063.2021.1994040
https://doi.org/10.1080/03772063.2021.1994040
Publikováno v:
IEEE Transactions on Applied Superconductivity. 30:1-9
This article comprehensively reviews the theoretical attempts toward prediction and subsequent realization of superconductivity in graphene and other two-dimensional (2-D) elemental materials and their compounds. From the large family of 2-D material
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55e2ea086da5935044921b6fd5def3d8
https://doi.org/10.1109/tasc.2019.2954617
https://doi.org/10.1109/tasc.2019.2954617
Publikováno v:
Circuits, Systems, and Signal Processing. 39:4281-4296
This paper presents a method for the detection of parametric faults in linear filters with the help of impulse response which is studied on the basis of cross-correlation, a statistical metric. Impulse input is generated with delay flip flops and R
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::333babacdfccd7d34acb115ef2fb4635
https://doi.org/10.1007/s00034-020-01375-0
https://doi.org/10.1007/s00034-020-01375-0
Autor:
Kasturi Ghosh, Benukar Biswas
Publikováno v:
International Journal of Current Microbiology and Applied Sciences. 8:941-944
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::30959abd3c531ffab7d9f721e39c6ef4
https://doi.org/10.20546/ijcmas.2019.801.102
https://doi.org/10.20546/ijcmas.2019.801.102
Publikováno v:
IEEE Transactions on Nanotechnology. 18:119-125
The target of this paper is to theoretically investigate the probability of gas (both oxidizing and reducing) adsorption on the van der Waals heterojunction formed between p-type reduced graphene oxide (rGO) and n-type two-dimensional monolayer of Zn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a052b78870a8c67c5c31746ce2b1b57
https://doi.org/10.1109/tnano.2018.2884171
https://doi.org/10.1109/tnano.2018.2884171
Publikováno v:
VLSI Design
In this work, a cost-effective methodology has been proposed for estimating functional parameters of analog circuits to ensure faster production testing. The new test algorithm predicts the functional parameters of the circuit under test from the out
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccea639066188ae1cd29ae9ffd69390b
https://doi.org/10.1109/vlsid51830.2021.00058
https://doi.org/10.1109/vlsid51830.2021.00058
Publikováno v:
ATS
Features extracted from single domain information cannot maximally reveal the state of the circuit since parametric fault features of analog circuits are quantified according to the application of the circuit. To combat this shortcoming, features fro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::900ce707eec134c7c60e8721af4bba80
https://doi.org/10.1109/ats49688.2020.9301544
https://doi.org/10.1109/ats49688.2020.9301544
Publikováno v:
2020 IEEE International Test Conference India.
In this work, the diagnosis of hard and soft faults in analog circuits has been addressed using Wavelet Transform as a preprocessor and Support Vector Machine (SVM) as a classifier. Test circuits have been excited with random analog signal and the ou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::baf7a489194e014801125e59734f3388
https://doi.org/10.1109/itcindia49857.2020.9171798
https://doi.org/10.1109/itcindia49857.2020.9171798