Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Karthik Chandrasekharan"'
Publikováno v:
Frontiers in Pharmacology, Vol 10 (2020)
Non-alcoholic fatty liver disease (NAFLD) is the most common cause of chronic liver disease worldwide. The most common cause of mortality in NAFLD is cardiovascular disease (CVD), and a key of focus in drug development is to discover therapies that t
Externí odkaz:
https://doaj.org/article/08aa25b8d5824d5fb2eee1f3ac478133
Autor:
James Hallimond Brindley, Falguni Tailor, Karthik Chandrasekharan, Kathryn Waller, Wenhao Li, Kalpana Devalia, Francesca Rosini, John Loy, William Alazawi
Publikováno v:
Journal of Hepatology. 77:S698
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd09593901d35dce8378c7a4cf1b8b50
https://doi.org/10.1016/s0168-8278(22)01712-3
https://doi.org/10.1016/s0168-8278(22)01712-3
Autor:
Ronald D. Schrimpf, J. K. Wang, Kai Ni, Bharat L. Bhuva, Karthik Chandrasekharan, Balaji Narasimham
Publikováno v:
IEEE Transactions on Nuclear Science. 64:353-358
A charge-steering based latch hardening technique with very low performance tradeoff and significant SEU hardness is presented. Mixed-mode 3D-TCAD simulations are used to illustrate the effect of charge steering in reducing the amount of collected ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a7f9a4e40bba160e8e204b0b22fad62
https://doi.org/10.1109/tns.2016.2638443
https://doi.org/10.1109/tns.2016.2638443
Publikováno v:
Frontiers in Pharmacology, Vol 10 (2020)
Frontiers in Pharmacology
Frontiers in Pharmacology
Non-alcoholic fatty liver disease (NAFLD) is the most common cause of chronic liver disease worldwide. The most common cause of mortality in NAFLD is cardiovascular disease (CVD), and a key of focus in drug development is to discover therapies that t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::260fcd14c7e1657307e2d935d36e3827
https://pubmed.ncbi.nlm.nih.gov/31969816
https://pubmed.ncbi.nlm.nih.gov/31969816
Publikováno v:
IRPS
A pulsed-DICE latch design that operates similar to an edge-triggered flip-flop with improved SER performance is presented. Design was implemented along with conventional D-flip-flop and conventional DICE flip-flop in 16 nm and 7 nm bulk FinFET CMOS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d08582e009c32ebe64642d503ba753be
https://doi.org/10.1109/irps.2019.8720408
https://doi.org/10.1109/irps.2019.8720408
Autor:
James Brindley, Falguni Tailor, Karthik Chandrasekharan, Kathryn Waller, Anja Versteeg-de Jong, Kalpana Devalia, Sanjay Agrawal, Francesca Rosini, John Loy, William Alazawi
Publikováno v:
Journal of Hepatology. 73:S664
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::347d89910c1f42a2d7275216def30fc4
https://doi.org/10.1016/s0168-8278(20)31789-x
https://doi.org/10.1016/s0168-8278(20)31789-x
Autor:
N. J. Gaspard, Karthik Chandrasekharan, Z. Liu, Jeffrey S. Kauppila, Gregory Djaja, Bharat L. Bhuva, Balaji Narasimham, J. K. Wang
Publikováno v:
IEEE Transactions on Nuclear Science. 59:2847-2851
A novel D-Flip-Flop design using hysteresis to improve single-event hardness with low performance overhead is presented. Layout-aware sensitive area simulations were used to estimate the improvement in cross-section for the proposed hysteresis DFF (H
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23325af538107a6b28da190dfb2fd4a5
https://doi.org/10.1109/tns.2012.2223762
https://doi.org/10.1109/tns.2012.2223762
Autor:
Bharat L. Bhuva, Gregory Djaja, Balaji Narasimham, N. J. Gaspard, T. R. Assis, N. N. Mahatme, Karthik Chandrasekharan, J. K. Wang
Publikováno v:
2014 IEEE International Reliability Physics Symposium.
A novel pulsed-latch design using hysteresis that operates similarly to an edge-triggered flip-flop with improved SER performance is presented. Design was implemented along with standard D-flip-flop (D-FF) and DICE flip-flop in a 20 nm CMOS process.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::242c72d06c333d80f9cbfa6100466f6b
https://doi.org/10.1109/irps.2014.6861095
https://doi.org/10.1109/irps.2014.6861095
Autor:
L. Keegan, Karthik Chandrasekharan, J. K. Wang, Balaji Narasimham, Gregory Djaja, S. Risch, J. Spillane
Publikováno v:
2013 IEEE International Reliability Physics Symposium (IRPS).
Chip-level logic masking simulations were performed on a network processor with ~1.75M flip-flops to identify the masking factors and the functional blocks that contribute to most errors. Results indicate that most errors originate from a few functio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0ac3d549085783c357a97af31c16013
https://doi.org/10.1109/irps.2013.6531990
https://doi.org/10.1109/irps.2013.6531990