Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Karl W. Barth"'
Autor:
Christopher N. King, Anna W. Topol, Karl W. Barth, Kathleen Dunn, Katharine Dovidenko, Richard T. Tuenge, Guillermo Nuesca, Alain E. Kaloyeros, Brian K. Taylor
Publikováno v:
Journal of Materials Research. 19:697-706
Results are presented from a systematic investigation to design and optimize a low-pressure chemical vapor deposition (CVD) process for manganese-doped zinc sulfide (ZnS:Mn) thin films for electroluminescent (EL) device applications. The CVD process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e44713d1e47507a1d8767415ac39635
https://doi.org/10.1557/jmr.2004.19.3.697
https://doi.org/10.1557/jmr.2004.19.3.697
Autor:
E. Soininen, Karl W. Barth, Timo Sajavaara, Jarkko Ihanus, Juhani Keinonen, Alain E. Kaloyeros, Mikko Ritala, Markku Leskelä, William Harris, Anna W. Topol, Wounjhang Park
Publikováno v:
Journal of Applied Physics. 94:3862-3868
Observed structural, compositional, and optical differences between blue- and green-emitting SrS:Cu thin films deposited by the atomic layer deposition technique were studied. The use of hydrogen in the deposition process resulted in green-emitting e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e33434b69b90b3571af13ba577a085a
https://doi.org/10.1063/1.1603349
https://doi.org/10.1063/1.1603349
Autor:
Denis Endisch, Janice E. Lau, Anna W. Topol, Alain E. Kaloyeros, Gregory G. Peterson, Mark Delarosa, Christopher N. King, Karl W. Barth, Richard T. Tuenge
Publikováno v:
Journal of The Electrochemical Society. 145:4271-4276
In this paper, results are presented from a systematic investigation which aimed to evaluate the performance and efficiency of tetrakis(2,2,6,6-tetramethyl-3,5-heptadionato)cerium(IV), or Ce(tmhd) 4 , as the cerium dopant source in the atomic layer e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08003b9d88f5d99e579ff5a75184d176
https://doi.org/10.1149/1.1838950
https://doi.org/10.1149/1.1838950
Autor:
Christopher N. King, Denis Endisch, J. Lau, Gregory G. Peterson, D. Tuenge, Karl W. Barth, Alain E. Kaloyeros
Publikováno v:
MRS Proceedings. 471
SrS:Ce is an important material for full color electroluminescent (EL) flat panel displays. Using a combination of SrS:Ce/ZnS:Mn and appropriate color filters high quality full color displays have been demonstrated [1]. Major issues for commercially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3f3508fe61c6f9db3834665d650a7ab
https://doi.org/10.1557/proc-471-269
https://doi.org/10.1557/proc-471-269
Autor:
Janice E. Lau, Richard T. Tuenge, Christopher N. King, Alain E. Kaloyeros, Denis Endisch, Anna W. Topol, Karl W. Barth, Gregory G. Peterson
Publikováno v:
Journal of The Electrochemical Society. 148:C427
A systematie evaluation was made of the performance and efficiency of tris (cyclopentadienyl)cerium, Ce(CPD), as potential dopant source in atomic layer epitaxy (ALE) and chemical vapor deposition (CVD) of Ce-doped strontium sulfide (SrS:Ce) for thin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd395c58251adb61c64fafc01e7149e1
https://doi.org/10.1149/1.1370965
https://doi.org/10.1149/1.1370965
Autor:
Janice E. Lau, Denis Endisch, Christopher N. King, Alain E. Kaloyeros, Karl W. Barth, Richard T. Tuenge, Gregory G. Peterson
Publikováno v:
Journal of The Electrochemical Society. 147:2174
Results are presented from a systematic study to develop and optimize a metallorganic chemical vapor deposition process for the growth of high brightness cerium-doped strontium sulfide (SrS:Ce) thin films for electroluminescent (EL) display applicati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68f84684ec5509a32a81c5d965e8f91b
https://doi.org/10.1149/1.1393503
https://doi.org/10.1149/1.1393503
Publikováno v:
Journal of The Electrochemical Society. 146:1243-1243
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5637d40d0203e79ff0e788cab23c5a6
https://doi.org/10.1149/1.1391752
https://doi.org/10.1149/1.1391752
Autor:
Xu Ouyang, Oliver D. Patterson, Karl W. Barth, Jay W. Strane, Hyoung H. Kang, Christian Lavoie, K. Wu
Publikováno v:
Scopus-Elsevier
A methodology for detecting silicide pipes on SOI technology in-line soon after their formation is described. Techniques currently exist to detect pipes in-line, but only much later in the process. This methodology, which is based on voltage contrast
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::581b4105ae4b7e78358f8d2569353015
http://www.scopus.com/inward/record.url?eid=2-s2.0-49649086070&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-49649086070&partnerID=MN8TOARS
