Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Karim Monfil"'
Autor:
Gabriel Omar Mendoza Conde, José Alberto Luna López, Zaira Jocelyn Hernández Simón, José Álvaro David Hernández de la Luz, Karim Monfil Leyva, Jesús Carrillo López, Haydee Patricia Martínez Hernández, Erick Gastellóu Hernández, Dainet Berman Mendoza, Javier Flores Méndez
Publikováno v:
Nanomaterials, Vol 13, Iss 7, p 1271 (2023)
In this work, hybrid structures formed by nanostructured layers, which contain materials, such as porous silicon (PSi), carbon nanotubes (CNTs), graphene oxide (GO), and silicon-rich oxide (SRO), were studied. The PSi layers were obtained by electroc
Externí odkaz:
https://doaj.org/article/da0015ba32ae454aae24d4d8ab6ad4c6
Autor:
Ana C. Piñón Reyes, Roberto C. Ambrosio Lázaro, Karim Monfil Leyva, José A. Luna López, Javier Flores Méndez, Aurelio H. Heredia Jiménez, Ana L. Muñoz Zurita, Francisco Severiano Carrillo, Esteban Ojeda Durán
Publikováno v:
Micromachines, Vol 12, Iss 12, p 1508 (2021)
In this paper, a n-i-p planar heterojunction simulation of Sn-based iodide perovskite solar cell (PSC) is proposed. The solar cell structure consists of a Fluorine-doped tin oxide (FTO) substrate on which titanium oxide (TiO2) is placed; this materia
Externí odkaz:
https://doaj.org/article/e46fd91102f9429bbad71e7d14ad1f06
Autor:
Haydee P. Martínez, José A. Luna, Roberto Morales, José F. Casco, José A. D. Hernández, Adan Luna, Zaira J. Hernández, Gabriel Mendoza, Karim Monfil, Raquel Ramírez, Jesús Carrillo, Javier Flores
Publikováno v:
Nanomaterials, Vol 11, Iss 4, p 943 (2021)
In this work, electroluminescence in Metal-Insulator-Semiconductors (MIS) and Metal-Insulator-Metal (MIM)-type structures was studied. These structures were fabricated with single- and double-layer silicon-rich-oxide (SRO) films by means of Hot Filam
Externí odkaz:
https://doaj.org/article/b50298603e0b458581ecc84144afecfa
Autor:
Francisco Ramírez-González, Godofredo García-Salgado, Enrique Rosendo, Tomás Díaz, Fabiola Nieto-Caballero, Antonio Coyopol, Román Romano, Alberto Luna, Karim Monfil, Erick Gastellou
Publikováno v:
Sensors, Vol 20, Iss 17, p 4942 (2020)
We studied the influences of the thickness of the porous silicon layer and the conductivity type on the porous silicon sensors response when exposed to ethanol vapor. The response was determined at room temperature (27 ∘C) in darkness using a horiz
Externí odkaz:
https://doaj.org/article/c835235af5ce4d45a8a605bacfcd5522
Autor:
Haydee Patricia Martínez Hernández, José Alberto Luna López, José Álvaro David Hernández de la Luz, Adan Luna Flores, Karim Monfil Leyva, Godofredo García Salgado, Jesús Carrillo López, Rafael Ordoñez Flores, Sergio Alfonso Pérez García, Zaira Jocelyn Hernández Simón, Gabriel Omar Mendoza Conde, Raquel Ramírez Amador
Publikováno v:
Crystals, Vol 10, Iss 2, p 127 (2020)
This work is focused on making a correlation between results obtained by using spectroscopy and microscopy techniques from single and twofold-layer Silicon-Rich Oxide (SRO) films. SRO films single-layer and twofold-layer characterizations were compar
Externí odkaz:
https://doaj.org/article/926c340c7dde4318a2ec5137426af749
Akademický článek
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Autor:
Hernández Simón, Zaira J., Luna López, José A., David Hernández De La Luz, José A., Mendoza Conde, Gabriel O., Leyva, Karim Monfil, Herrera, Oscar Raymond, Moreno Moreno, Mario, Martínez Hernández, Haydee P., Flores, Eduardo
Publikováno v:
In Journal of Alloys and Compounds 10 September 2023 955
Autor:
Simón, Zaira Jocelyn Hernández, López, José Alberto Luna, de la Luz, Álvaro David Hernández, Salgado, Godofredo García, Leyva, Karim Monfil, López, Jesús Carrillo, Conde, Gabriel Omar Mendoza, Lara, Alfredo Benítez, Hernández, Haydee Patricia Martínez, Hernández, Erick Gastellou, Méndez, Javier Flores
Publikováno v:
In Surfaces and Interfaces October 2021 26
Akademický článek
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Autor:
Erick AYALA-SÁNCHEZ, José Álvaro David HERNÁNDEZ-DE LA LUZ, Karim MONFIL-LEYVA, José Alberto LUNA-LÓPEZ
Publikováno v:
Journal of Scientific and Technical Applications. :1-15
Objectives: The present review work shows a detailed study of the optical and structural characteristics of SiOx films using different deposit techniques, among which employing the technique of Chemical Deposit in Vapor Phase by Hot Filament (HFCVD),
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dcd0808e2da39595a05f6f4ed50c09a
https://doi.org/10.35429/jsta.2023.23.9.1.15
https://doi.org/10.35429/jsta.2023.23.9.1.15