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pro vyhledávání: '"Karakurt, Ahmet Hakan"'
Autor:
Erdem, Ege, Demiralp, Berke, Pisheh, Hadi S, Firoozy, Peyman, Karakurt, Ahmet Hakan, Hanay, M. Selim
The scanning electron microscope (SEM) recordings of dynamic nano-electromechanical systems (NEMS) are difficult to analyze due to the noise caused by low frame rate, insufficient resolution and blurriness induced by applied electric potentials. Here
Externí odkaz:
http://arxiv.org/abs/2307.08786
Autor:
Erdem, Ege, Demiralp, Berke, Pisheh, Hadi S., Firoozy, Peyman, Karakurt, Ahmet Hakan, Hanay, M. Selim
Publikováno v:
Journal of Applied Physics; 12/14/2023, Vol. 134 Issue 22, p1-8, 8p
