Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Kanji Hirabayashi"'
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of Electronic Testing. 4:131-135
This article proposes a 7-valued logic appropriate for test generation and fault simulation, in the area of robust tests for gate delay faults, and a straightforward simulation strategy for sequential circuits. It is shown that a purely qualitative l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c811687bc9c6cd0989062a1a36b3aae9
https://doi.org/10.1007/bf00971642
https://doi.org/10.1007/bf00971642
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of Electronic Testing. 2:205-208
This article presents a new approach to implementing self-checking circuits in CMOS technology. Implementations are made self-checking with respect to a single line stuck-at 0/1 fault. It is assumed that stuck faults at a common gate of neighboring P
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6198a298c280f96439b0628fa07da8b2
https://doi.org/10.1007/bf00133504
https://doi.org/10.1007/bf00133504
Publikováno v:
Journal of Electronic Testing. 1:235-238
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4706c3db8d921519a108ba1404540879
https://doi.org/10.1007/bf00938687
https://doi.org/10.1007/bf00938687
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of Electronic Testing: Theory and Applications (JETTA). 8:215-217
A 7-valued logic appropriate for hazard simulation of sequential circuits is investigated in this letter. The 5-valued system of Lin and Reddy is extended to discriminate transitions with and without hazard. We assume that hazards are damped in the f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::013200c5be4bfa047f6791d83f0ceeda
https://doi.org/10.1007/bf02341825
https://doi.org/10.1007/bf02341825
Autor:
Kanji Hirabayashi
Publikováno v:
Applied Physics Letters. 68:1978-1980
In this letter, we calculate the interface state energy in nitrogen incorporated gate oxides by using a one‐dimensional two‐band model and Penn’s model connecting the refractive index with typical band gap. We estimate the number of dangling bo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42bdaf3e0df4088512774b8b44a777f6
https://doi.org/10.1063/1.115645
https://doi.org/10.1063/1.115645
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of Electronic Testing. 17:543-544
In this letter we report the formal verification of microprocessors. After we describe algebraically a bit-sliced microprocessor at both function and logic levels, we apply the symbolic manipulation of Mathematica.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e05fa78285e755918857d3322d32f2a
https://doi.org/10.1023/a:1012824822961
https://doi.org/10.1023/a:1012824822961
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of Electronic Testing. 13:321-322
In this letter we report the formal verification of encryption and decryption circuits. After we describe algebraically a simple modular arithmetic circuit at both function and logic levels, we apply the symbolic manipulation of Mathematica.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ef5fb4e1a5d55192d5689f14daaf76b
https://doi.org/10.1023/a:1008342004877
https://doi.org/10.1023/a:1008342004877
Publikováno v:
Integration. 3:3-12
This paper describes an efficient test generation method based on activation and defect-drive using random patterns. The activation process generates patterns to control any circuit node to 0 and 1. After the activation process, the defect-drive prop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc4d0956c8a3b60f4f17412fb3f00c54
https://doi.org/10.1016/0167-9260(85)90051-3
https://doi.org/10.1016/0167-9260(85)90051-3
Publikováno v:
Psychiatry and Clinical Neurosciences. 33:81-96
Summary Clinical and neuropathological findings of a 63-year-old male and a 25-year-old female with Down's syndrome are presented. Neuropathological examination of the older patient revealed intense features of Alzheimer's disease or senile dementia,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d0a4154391ae5b05becd7b955edfb98
https://doi.org/10.1111/j.1440-1819.1979.tb00177.x
https://doi.org/10.1111/j.1440-1819.1979.tb00177.x
Autor:
Kanji Hirabayashi
Publikováno v:
Journal of the Physical Society of Japan. 22:590-597
Stresses around an edge dislocation near a free surface are calculated using two kinds of elastic representations (Volterra dislocations): One is a ring deformed by removal of a slice of uniform thickness and the other is a ring deformed by slip. Onl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f08ec30b50f712f19e98ac2dcdab49f
https://doi.org/10.1143/jpsj.22.590
https://doi.org/10.1143/jpsj.22.590