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pro vyhledávání: '"Kanika Kanwal"'
Publikováno v:
2019 IEEE International Test Conference India (ITC India).
Traditional software-based scan chain diagnosis methodology requires failures from scan chain shift pattern(s) and a few logic patterns to identify the location of defective flop(s). The number of failures required for this methodology is massively h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca74fecfe0b90eab885ea4b6bb1a2867
https://doi.org/10.1109/itcindia46717.2019.8979753
https://doi.org/10.1109/itcindia46717.2019.8979753
