Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Kaneko NH"'
Autor:
Nakamura S; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Matsumaru D; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Yamahata G; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan., Oe T; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Chae DH; Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Republic of Korea., Okazaki Y; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Takada S; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Maruyama M; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Fujiwara A; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan., Kaneko NH; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan.
Publikováno v:
Nano letters [Nano Lett] 2024 Jan 10; Vol. 24 (1), pp. 9-15. Date of Electronic Publication: 2023 Dec 19.
Autor:
Wang J; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Edlbauer H; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Richard A; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Ota S; Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan.; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Japan., Park W; Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon, South Korea., Shim J; Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon, South Korea.; Arnold Sommerfeld Center for Theoretical Physics, Center for NanoScience, and Munich Center for Quantum Science and Technology, Ludwig-Maximilians-Universität München, Munich, Germany., Ludwig A; Lehrstuhl für Angewandte Festkörperphysik, Ruhr-Universität Bochum, Bochum, Germany., Wieck AD; Lehrstuhl für Angewandte Festkörperphysik, Ruhr-Universität Bochum, Bochum, Germany., Sim HS; Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon, South Korea., Urdampilleta M; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Meunier T; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Kodera T; Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan., Kaneko NH; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Japan., Sellier H; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France., Waintal X; Université Grenoble Alpes, CEA, INAC-Pheliqs, Grenoble, France., Takada S; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Japan., Bäuerle C; Université Grenoble Alpes, CNRS, Institut Néel, Grenoble, France. christopher.bauerle@neel.cnrs.fr.
Publikováno v:
Nature nanotechnology [Nat Nanotechnol] 2023 Jul; Vol. 18 (7), pp. 721-726. Date of Electronic Publication: 2023 May 11.
Autor:
Misawa T; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan.; Laboratory for Materials and Structures, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8503, Japan., Nakamura S; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Okazaki Y; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Fukuyama Y; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Nasaka N; Laboratory for Materials and Structures, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8503, Japan., Ezure H; Laboratory for Materials and Structures, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8503, Japan., Urano C; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Kaneko NH; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan., Sasagawa T; Laboratory for Materials and Structures, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8503, Japan.
Publikováno v:
Journal of physics. Condensed matter : an Institute of Physics journal [J Phys Condens Matter] 2020 Jul 06; Vol. 32 (40). Date of Electronic Publication: 2020 Jul 06.
Autor:
Amagai Y; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Shimazaki T; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Okawa K; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Kawae T; Department of Applied Quantum Physics, Kyusyu University, Fukuoka 819-0395, Japan., Fujiki H; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan., Kaneko NH; National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2020 Jan 01; Vol. 91 (1), pp. 014903.
Autor:
Oe T; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba 305-8563, Japan., Rigosi AF; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Kruskopf M; University of Maryland, Joint Quantum Institute, College Park, MD 20742, USA., Wu BY; Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan., Lee HY; Theiss Research, La Jolla, CA 92037, USA., Yang Y; University of Maryland, Joint Quantum Institute, College Park, MD 20742, USA., Elmquist RE; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Kaneko NH; National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba 305-8563, Japan., Jarrett DG; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
IEEE transactions on instrumentation and measurement [IEEE Trans Instrum Meas] 2019; Vol. 0.
Autor:
Okazaki Y; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa, 243-0198, Japan. yuma.okazaki@aist.go.jp.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8563, Japan. yuma.okazaki@aist.go.jp., Mahboob I; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa, 243-0198, Japan., Onomitsu K; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa, 243-0198, Japan., Sasaki S; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa, 243-0198, Japan., Nakamura S; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8563, Japan., Kaneko NH; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, 305-8563, Japan., Yamaguchi H; NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa, 243-0198, Japan. yamaguchi.hiroshi@lab.ntt.co.jp.
Publikováno v:
Nature communications [Nat Commun] 2018 Aug 28; Vol. 9 (1), pp. 2993. Date of Electronic Publication: 2018 Aug 28.