Zobrazeno 1 - 10
of 71
pro vyhledávání: '"Kamejima, T."'
Publikováno v:
Journal of Applied Physics; Aug1979, Vol. 50 Issue 8, p5150-5157, 8p
Autor:
Homma, Y., Tohjou, F., Masamoto, A., Shibata, M., Shichi, H., Yoshioka, Y., Adachi, T., Akai, T., Gao, Y., Hirano, M., Hirano, T., Ihara, A., Kamejima, T., Koyama, H., Maier, M., Matsumoto, S., Matsunaga, H., Nakamura, T., Obata, T., Okuno, K., Sadayama, S., Sasa, K., Sasakawa, K., Shimanuki, Y., Suzuki, S., Sykes, D.E., Tachikawa, I., Takase, H., Tanigaki, T., Tomita, M., Tosho, H., Kurosawa, S.
Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. M
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::82e22429732ac5c84a3bafc87193de96
https://publica.fraunhofer.de/handle/publica/193344
https://publica.fraunhofer.de/handle/publica/193344
Publikováno v:
2010 International Power Electronics Conference (IPEC); 2010, p1071-1076, 6p
Publikováno v:
2010 International Conference on Electrical Machines & Systems (ICEMS); 2010, p487-492, 6p
Secondry Ion Mass Spectrometry Round-robin Study of Relative Sensitivity Factors in Gallium Arsenide
Autor:
HOMMA, Y., TOHJOU, F., MASAMOTO, A., SHIBATA, M., SHICHI, H., YOSHIOKA, Y., ADACHI, T., AKAI, T., GAO, Y., HIRANO, M., HIRANO, T., IHARA, A., KAMEJIMA, T., KOYAMA, H., MAIER, M., MATSUMOTO, S., MATSUNAGA, H., NAKAMURA, T., OBATA, T.
Publikováno v:
Surface & Interface Analysis: SIA; Feb1998, Vol. 26 Issue 2, p144, 11p
Publikováno v:
IEEE Journal of Quantum Electronics; 1987, Vol. 23 Issue 6, p720-724, 5p
Publikováno v:
IEEE Journal of Quantum Electronics; 1979, Vol. 15 Issue 8, p775-781, 7p
Autor:
Ishida, K., Kamejima, T.
Publikováno v:
Journal of Electronic Materials; Jan1979, Vol. 8 Issue 1, p57-73, 17p
Publikováno v:
Applied Physics Letters; 1982, Vol. 40 Issue 11, p921-923, 3p
Publikováno v:
Applied Physics Letters; 1980, Vol. 36 Issue 8, p655-657, 3p