Automatic batik motifs classification using various combinations of SIFT features moments and k-Nearest Neighbor.

Autor: Setyawan, Iwan, Timotius, Ivanna K., Kalvin, Marchellius

Publikováno v: 2015 7th International Conference on Information Technology & Electrical Engineering (ICITEE); 1/1/2015, p269-274, 6p