Zobrazeno 1 - 10
of 177
pro vyhledávání: '"Kalem, S."'
Publikováno v:
Philosophical Magazine B53 1986
The evolution is presented of infrared transmission spectra of hydrogenated and chlorinated amorphous silicon films versus the chlorine concentration and the annealing temperature. As the chlorine content increases, an increase of the 2100 cm-1 band
Externí odkaz:
http://arxiv.org/abs/2110.03770
Publikováno v:
Applied Physics-A 98, 423(2010)
The surface of a single crystal Germanium wafer was transformed to crystals of germanium fluorides and oxides upon exposure to a vapor of HF and HNO3 chemical mixture. Structure analysis indicate that the transformation results in a germanate polycry
Externí odkaz:
http://arxiv.org/abs/1512.08001
Publikováno v:
Thin Solid Films 518, 2377(2010)
Optical properties of dislocations free state-of-the-art Germanium(Ge) and Germanium-oninsulator(GeOI) wafers have been characterized using Fourier transformed infrared spectroscopy at oblique incidence, attenuated total reflectance, laser Raman scat
Externí odkaz:
http://arxiv.org/abs/1512.08005
Publikováno v:
Nanotechnology 20 (2009) 445303 (7pp)
A convenient method has been developed to thin electron beam fabricated Silicon nanopillars under controlled surface manipulation by transforming the surface of the pillars to an oxide shell layer followed by the growth of sacrificial ammonium silico
Externí odkaz:
http://arxiv.org/abs/1512.07996
Autor:
Kalem, S, Werner, P, Arthursson, Ö, Talalaev, V, Nilsson, B, Hagberg, M, Frederiksen, H, Södervall, U
Publikováno v:
Nanotechnology 22 (2011) 235307
Physical properties of black Silicon (b-Si) formed on Si wafers by reactive ion etching in chlorine plasma are reported in an attempt to clarify the formation mechanism and the origin of the observed optical and electrical phenomena which are promisi
Externí odkaz:
http://arxiv.org/abs/1105.3011
Akademický článek
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Autor:
Kalem, S., Werner, P., Hagberg, M., Nilsson, B., Talalaev, V., Arthursson, Ö., Frederiksen, H., Södervall, U.
Publikováno v:
In Microelectronic Engineering August 2011 88(8):2593-2596
Autor:
Wolfsteller, A., Geyer, N., Nguyen-Duc, T.-K., Das Kanungo, P., Zakharov, N.D., Reiche, M., Erfurth, W., Blumtritt, H., Kalem, S., Werner, P., Gösele, U.
Publikováno v:
In Thin Solid Films 2010 518(9):2555-2561
Publikováno v:
In Clinical Neurophysiology 2008 119(2):459-465