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pro vyhledávání: '"Kalceff, W."'
A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functiona
Externí odkaz:
http://arxiv.org/abs/physics/0305018
Publikováno v:
In Thin Solid Films 2005 489(1):37-41
Autor:
Stevens-Kalceff, M. A., Prawer, S., Kalceff, W., Orwa, J. O., Peng, J. L., McCallum, J. C., Jamieson, D. N.
Publikováno v:
Journal of Applied Physics; Dec2008, Vol. 104 Issue 11, p113514, 9p, 3 Charts, 7 Graphs
Publikováno v:
Journal of Applied Physics; 1/15/2007, Vol. 101 Issue 2, p023118-N.PAG, 6p, 1 Chart, 8 Graphs
Publikováno v:
Educational Technology & Society, Vol 7, Iss 3, Pp 9-20 (2004)
Worldwide, electronic learning (E-learning) has become an important part of the education agenda in the last decade. The Suan Dusit Rajabhat University (SDRU), Thailand has made significant efforts recently to use Internet technologies to enhance lea
A Bayesian/Maximum entropy (MaxEnt) emthod is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreemetn with transmission electron microscopy results, while d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______363::b176a3048d989b289bcf8d76c75790fa
https://hdl.handle.net/10453/6663
https://hdl.handle.net/10453/6663
Publikováno v:
Journal of Applied Physics; 11/15/1994, Vol. 76 Issue 10, p6153, 3p