Zobrazeno 1 - 10
of 507
pro vyhledávání: '"Kakavelakis, G."'
Autor:
Cadore, A. R., Rosa, B. L. T., Paradisanos, I., Mignuzzi, S., De Fazio, D., Alexeev, E. M., Muench, J. E., Kakavelakis, G., Shinde, S. M., Yoon, D., Tongay, S., Watanabe, K., Taniguchi, T., Lidorikis, E., Goykhman, I., Soavi, G., Ferrari, A. C.
Publikováno v:
Phys. Rev B 108, 035420 (2023)
Layered material heterostructures (LMHs) can be used to fabricate electroluminescent devices operating in the visible spectral region. A major advantage of LMH-light emitting diodes (LEDs) is that electroluminescence (EL) emission can be tuned across
Externí odkaz:
http://arxiv.org/abs/2305.01791
Autor:
Gagaoudakis, E., Panagiotopoulos, A., Maksudov, T., Moschogiannaki, M., Katerinopoulou, D., Kakavelakis, G., Kiriakidis, G., Binas, V., Kymakis, E., Petridis, K.
Hydrogen (H2) is a well-known reduction gas and for safety reasons is very important to be detected. The most common systems employed along its detection are metal oxide-based elements. However, the latter demand complex and expensive manufacturing t
Externí odkaz:
http://arxiv.org/abs/1909.06625
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Volochanskyi O; Department of Low-dimensional Systems, J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejšková 2155/3, 18223 Prague, Czech Republic.; Faculty of Chemical Engineering, Department of Physical Chemistry, University of Chemistry and Technology in Prague, Technická 5, 14200 Prague, Czech Republic., Haider G; Department of Low-dimensional Systems, J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejšková 2155/3, 18223 Prague, Czech Republic., Alharbi EA; Microelectronics and Semiconductors Institute, King Abdulaziz City for Science and Technology (KACST), Riyadh 11442, Saudi Arabia.; École Polytechnique Fedérale du Lausanne, Laboratory of Photonics and Interfaces, Station 6, Lausanne 1015, Switzerland., Kakavelakis G; École Polytechnique Fedérale du Lausanne, Laboratory of Photonics and Interfaces, Station 6, Lausanne 1015, Switzerland.; Department of Electronic Engineering, School of Engineering, Hellenic Mediterranean University, Romanou 3, Chalepa, GR-73100 Chania, Crete, Greece., Mergl M; Department of Low-dimensional Systems, J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejšková 2155/3, 18223 Prague, Czech Republic., Thakur MK; Department of Low-dimensional Systems, J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejšková 2155/3, 18223 Prague, Czech Republic., Krishna A; École Polytechnique Fedérale du Lausanne, Laboratory of Photonics and Interfaces, Station 6, Lausanne 1015, Switzerland., Graetzel M; École Polytechnique Fedérale du Lausanne, Laboratory of Photonics and Interfaces, Station 6, Lausanne 1015, Switzerland., Kalbáč M; Department of Low-dimensional Systems, J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejšková 2155/3, 18223 Prague, Czech Republic.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Oct 02; Vol. 16 (39), pp. 52789-52798. Date of Electronic Publication: 2024 Sep 19.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Perrakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece. gperrakis@iesl.forth.gr., Tasolamprou AC; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Physics, National and Kapodistrian University of Athens, 15784, Athens, Greece., Kakavelakis G; Department of Electronic Engineering, Hellenic Mediterranean University, Romanou 3, Chalepa, 73100, Chania, Crete, Greece. kakavelakis@hmu.gr.; Laboratory of Photonics and Interfaces, Institute of Chemical Sciences and Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland. kakavelakis@hmu.gr., Petridis K; Department of Electronic Engineering, Hellenic Mediterranean University, Romanou 3, Chalepa, 73100, Chania, Crete, Greece., Graetzel M; Laboratory of Photonics and Interfaces, Institute of Chemical Sciences and Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland., Kenanakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece., Tzortzakis S; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Crete, Greece.; Texas A&M University at Qatar, 23874, Doha, Qatar., Kafesaki M; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Crete, Greece.
Publikováno v:
Scientific reports [Sci Rep] 2024 Jan 04; Vol. 14 (1), pp. 548. Date of Electronic Publication: 2024 Jan 04.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Gagaoudakis, E, Panagiotopoulos, A, Maksudov, T, Moschogiannaki, M, Katerinopoulou, D, Kakavelakis, G, Kiriakidis, G, Binas, V, Kymakis, E, Petridis, K
Hydrogen (H2) is a well-known reduction gas and for safety reasons is very important to be detected. The most common systems employed along its detection are metal oxide-based elements. However, the latter demand complex and expensive manufacturing t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c4249a92d4304d21c01625c93df6558f
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.