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Autor:
Craig TM; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be., Kadu AA; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be.; Centrum Wiskunde & Informatica, Science Park 123, Amsterdam 1098 XG, The Netherlands., Batenburg KJ; Centrum Wiskunde & Informatica, Science Park 123, Amsterdam 1098 XG, The Netherlands.; Leiden Institute of Advanced Computer Science, Leiden University, Niels Bohrweg 1, 2333CA Leiden, The Netherlands., Bals S; Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be.
Publikováno v:
Nanoscale [Nanoscale] 2023 Mar 16; Vol. 15 (11), pp. 5391-5402. Date of Electronic Publication: 2023 Mar 16.