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Autor:
Zelenka, Claudius, Kamp, Marius, Strohm, Kolja, Kadoura, Akram, Johny, Jacob, Koch, Reinhard, Kienle, Lorenz
Accurately measuring the size, morphology, and structure of nanoparticles is very important, because they are strongly dependent on their properties for many applications. In this paper, we present a deep-learning based method for nanoparticle measur
Externí odkaz:
http://arxiv.org/abs/2207.14023
Autor:
Zelenka, Claudius, Kamp, Marius, Strohm, Kolja, Kadoura, Akram, Johny, Jacob, Koch, Reinhard, Kienle, Lorenz
Publikováno v:
In Ultramicroscopy April 2023 246