Zobrazeno 1 - 6
of 6
pro vyhledávání: '"KUTALOVA, M. I."'
Publikováno v:
Photoelectronics; № 27 (2018): Photoelectronics; 30
Photoelectronics; № 27 (2018): Photoelectronocs; 30
Photoelectronics; № 27 (2018): Photoelectronocs; 30
The pasty solder is used in the technology of the installation of electro-radio elements. Such elements can be microcircuits and optical and X-ray images microelectronic sensors with a hard raster [1]. Tinning of such sensor contact surfaces and prin
Publikováno v:
Photoelectronics; № 26 (2017); 124-138
The photovoltaic properties of CdS crystals with combined alloying have been investigated. An analytical expression for the dependence of the coefficient of damping of the intensities of exciting and quenching light has been received. For the first t
Publikováno v:
Photoelectronics; No. 25 (2016); 109-113
Photoelectronics; № 25 (2016); 109-113
Photoelectronics; № 25 (2016); 109-113
Abnormal dependence of volt-farad characteristics of «nonideal» heterojunctiоn barrier capacity is investigated. It is shown that in heterojunctions with the big concentration and non-uniform distribution of defects tunnel currents essentially inf
Autor:
Minaeva, O. P., Simanovych, N. S., Zatovskaya, N. P., Karakis, Y. N., Kutalova, M. I., Chemeresiuk, G. G.
Publikováno v:
Photoelectronics; No. 25 (2016); 131-140
Photoelectronics; № 25 (2016); 131-140
Photoelectronics; № 25 (2016); 131-140
The technology of processing of semiconductor crystals is developed in the corona discharge. It is established that as a result of this exposure, the samples acquire alternating spectral sensitivity. The observed phenomenon is explained by the emerge
Publikováno v:
Photoelectronics; № 24 (2015); 72-76
A set of studies aimed at clarifying the deviation from the stoichiometry of CuxS compound during the formation and followed over time to establish the characteristics of changes in the chemical composition of the heterojunction components were carri
Publikováno v:
Photoelectronics; № 23 (2014); 124-130
The paper puts forward a method for determination of semiconductor activation energy in end product. It is illustrated that band gap can be calculated at cutoffs on both axes of graphs ln(I)÷U, measured at different temperatures. Minimum temperature