Zobrazeno 1 - 10
of 1 007
pro vyhledávání: '"KPFM"'
Autor:
Ishaq Musa
Publikováno v:
Surfaces, Vol 7, Iss 3, Pp 770-785 (2024)
The optical characteristics and electrical behavior of zinc oxide nanorods (ZnO-NRs) and silver nanoparticles (Ag-NPs) were investigated using advanced scanning probe microscopy techniques. The study revealed that the ZnO nanorods had a length of abo
Externí odkaz:
https://doaj.org/article/e1b796940979451ea9ff54b6ce05085e
Autor:
Jinhyeong Jang, Soyun Joo, Jiwon Yeom, Yonghan Jo, Jingshu Zhang, Seungbum Hong, Chan Beum Park
Publikováno v:
Advanced Science, Vol 11, Iss 39, Pp n/a-n/a (2024)
Abstract Alzheimer's disease (AD) is the most frequent neurodegenerative disorder in the elderly aged over 65. The extracellular accumulation of beta‐amyloid (Aβ) aggregates in the brain is considered as the major event worsening the AD symptoms,
Externí odkaz:
https://doaj.org/article/dce8174d1ef849ee9025c0e2f47236d9
Autor:
Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar
Publikováno v:
Advanced Physics Research, Vol 3, Iss 7, Pp n/a-n/a (2024)
Abstract Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena. In its conventional form, KPFM fr
Externí odkaz:
https://doaj.org/article/90a3dc0386e9473588e04f0b44a9d0b0
Autor:
Ishaq Musa, Randa Faqi
Publikováno v:
Results in Materials, Vol 22, Iss , Pp 100570- (2024)
The electrical and optical characteristics of pure and Al-doped zinc oxide (ZnO) nanoparticles were analyzed. The work function of these nanoparticles was investigated using Kelvin Probe Force Microscopy (KPFM). The work function of the Al-doped ZnO
Externí odkaz:
https://doaj.org/article/82fcc9e9feb54b5ca87100ec5da62908
Publikováno v:
Cailiao Baohu, Vol 56, Iss 12, Pp 167-172 (2023)
In order to study the corrosion resistance of 904L super austenitic stainless steel welded joints in a simulated nuclear power plant tertiary loop water environment, the Kelvin probe force microscope (KPFM), electron backscatter diffraction (EBSD), e
Externí odkaz:
https://doaj.org/article/9bf046b454bc453399ee8e45caabb62c
Autor:
Mengyue Su, Jun Zhou, Yuqing Chen, Yilong Wang, Gan Jin, Haiyang Wang, Jiacheng Zhou, Xiaoyue Pang, Zepeng Lv, Kai Wu
Publikováno v:
Nanomaterials, Vol 14, Iss 19, p 1555 (2024)
The crystal structure has a great influence on the dielectric and piezoelectric performance of poly(vinylidene fluoride) (PVDF). In this work, we prepared PVDF films with two typical crystalline phases (α and β). In situ Kelvin probe force microsco
Externí odkaz:
https://doaj.org/article/6439feff47dc42c89f02d1db22f5a24e
Autor:
Zeinab Eftekhari, Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Andrea Cerreta, Ilka Hermes, Minh Nguyen, Guus Rijnders, Rebecca Saive
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 14, Iss 1, Pp 1059-1067 (2023)
In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated
Externí odkaz:
https://doaj.org/article/1ab30092194d4d219a10aa9d53ffea99
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 14, Iss 1, Pp 1068-1084 (2023)
We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force m
Externí odkaz:
https://doaj.org/article/ed855f1e03a54274bbd41ca22bc91f23
Autor:
Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert, Jean-Paul Kleider
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 14, Iss 1, Pp 725-737 (2023)
Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. In this work, we apply frequ
Externí odkaz:
https://doaj.org/article/2a858464138e484da6ec109d1f29cb2d
Autor:
Khaled Kaja, Ammar Assoum, Peter De Wolf, François Piquemal, Antonio Nehmee, Adnan Naja, Taha Beyrouthy, Mustapha Jouiad
Publikováno v:
Advanced Materials Interfaces, Vol 11, Iss 2, Pp n/a-n/a (2024)
Abstract Noninvasive and depth‐sensitive measurements of dielectric properties are becoming of great interest in advanced and complex nanostructured architectures. Here, a straightforward parallel approach applicable in peak force Kelvin probe forc
Externí odkaz:
https://doaj.org/article/e6a583beb9e14f76a183087b54744b54