Výsledky vyhledávání - "KORTE, STEFAN"

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Surface Conductivity of Si(100) and Ge(100) Surfaces Determined from Four-Point Transport Measurements Using an Analytical N-Layer Conductance Model

Autor: Just, Sven, Soltner, Helmut, Korte, Stefan, Cherepanov, Vasily, Voigtländer, Bert

Publikováno v: Phys. Rev. B 95, 075310 (2017)

An analytical N-layer model for charge transport close to a surface is derived from the solution of Poisson's equation and used to describe distance-dependent electrical four-point measurements on the microscale. As the N-layer model comprises a surf

Externí odkaz: http://arxiv.org/abs/1610.02239

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Akademický článek

Verwaltungssanktionsrecht. (German)

Autor: Korte, Stefan, Niehaus, Manuela

Publikováno v: JURA - Juristische Ausbildung; Jan2025, Vol. 47 Issue 1, p29-39, 11p

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Surface and Step Conductivities on Si(111) Surfaces

Autor: Just, Sven, Blab, Marcus, Korte, Stefan, Cherepanov, Vasily, Soltner, Helmut, Voigtländer, Bert

Publikováno v: Phys. Rev. Lett. 115, 066801 (2015)

Four-point measurements using a multi-tip scanning tunneling microscope (STM) are carried out in order to determine surface and step conductivities on Si(111) surfaces. In a first step, distance-dependent four-point measurements in the linear configu

Externí odkaz: http://arxiv.org/abs/1505.01288

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