Simulation of the microstructural evolution of a polymer crosslinked templated silica aerogel under high-strain-rate compression

Autor: K.T. Chu, Nicholas Leventis, Fang Wang, Jay C. Hanan, Hongbing Lu, Huiyang Luo, Chariklia Sotiriou-Leventis, Gitogo Churu, Boshen Fu

Publikováno v: Journal of Non-Crystalline Solids. 357:2063-2074

Surfactant-templated mesoporous silica aerogels (or nanofoams) with their entire skeletal framework nanoencapsulated conformally by a thin polyurea layer are emerging as materials with high specific strength and high energy absorption. In this paper

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9abc15286a0bc1a2f5cc8f55586fb695
https://doi.org/10.1016/j.jnoncrysol.2011.02.049

Cicerarin, a novel antifungal peptide from the green chickpea

Autor: K.T. Chu, K.H. Liu, T.B. Ng

Publikováno v: Peptides. 24:659-663

A peptide designated cicerarin, with an N-terminal amino acid sequence VKSTGRADDDLAVKTKYLPP dissimilar from known proteins and peptides and a molecular mass of 8 kDa, was isolated from seeds of the green chickpea Cicer arietinum cv green chickpea. Ci

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::274e37212c7265e87510b9f5d05f8ddf
https://doi.org/10.1016/s0196-9781(03)00134-7

Photoinduced electron transfer between donors and acceptors on micelle surfaces

Autor: K.T. Chu, Kristin Weidemaier, Michael D. Fayer, H. L. Tavernier

Publikováno v: Chemical Physics Letters. 276:309-315

Fluorescence time-dependence and fluorescence yield data are used to examine photoinduced electron transfer between N,N-dimethylaniline and octadecylrhodamine B on the surfaces of dodecyltrimethylammonium bromide (DTAB) and Triton X-100 micelles. The

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::22bc1a7e6b33937e13b1f25d2a6a7468
https://doi.org/10.1016/s0009-2614(97)00836-1

Contributors

Autor: Bizhan Aarabi, Jaimo Ahn, Michael C. Ain, Lawrence Alexander, Howard S. An, Paul A. Anderson, Ronald I. Apfelbaum, Jahangir Asghar, Matthew Owen Barrett, Sushil Basra, Amit Bhargava, Randy Bell, Carlo Bellabarba, Jason T. Bessey, Randal R. Betz, Ashok Biyani, Brian J. Blake, Christopher M. Bono, Douglas Brockmeyer, Darrel S. Brodke, Justin G. Brothers, Jacob M. Buchowski, Jonathan Carmouche, Kawanaa D. Carter, Kaisorn L. Chaichana, Jae-Chil Chang, Jens R. Chapman, John H. Chi, Kingsley R. Chin, Dean Chou, Sean D. Christie, Gordon K.T. Chu, Mary Cunningham, Richard A. Dal Canto, Keisha DePass, Harel Deutsch, Marcel F. Dvorak, Hossein Elgafy, Jonathan S. Erulkar, H. Francis Farhadi, Daniel Fassett, Michael G. Fehlings, Albert J. Fenoy, Bryan Ferguson, Michael A. Finn, John C. France, Brett A. Freedman, Peter G. Gabos, Robert W. Gaines, Steven Garfin, Daniel E. Gelb, Douglas Robert Gibula, Peter H. Gorman, Jonathan N. Grauer, Mitchel B. Harris, Robert F. Heary, Andrew C. Hecht, R. John Hurlbert, Mark Iguchi, Bryce A. Johnson, J. Patrick Johnson, Dori Kelly, A. Jay Khanna, Choll Kim, Daniel H. Kim, David H. Kim, Kee D. Kim, Se-Hoon Kim, Terrence T. Kim, Paul Klimo, Timothy R. Kuklo, Sanjeev Kumar, James P. Lawrence, Allan D. Levi, John Louis-Ugbo, Steven C. Ludwig, Glen Manzano, Sameer Mathur, Todd McCall, Ian E. McCutcheon, Samir Mehta, Ehud Mendel, Arnold H. Menezes, Robert W. Molinari, Praveen Mummaneni, David J. Nathan, Peter O. Newton, Stephen L. Ondra, Brian O'Shaughnessy, T. Glenn Pait, Jongsoo Park, Rakesh Patel, Andrew Perry, Frank M. Phillips, Kornelis A. Poelstra, John D. Pryor, Stephan M. Quinnan, Sheeraz Qureshi, Y. Raja Rampersaud, Gannon B. Randolph, Ganesh Rao, Ron I. Riesenburger, Mitchell F. Reiter, Daniel K. Resnick, Rolando F. Roberto, M.L. 'Chip' Routt, Edward Rustamzadeh, Virginia M. Salas, Dino Samartzis, Amer Samdani, Thomas A. Schildhauer, Joshua G. Schkrohowsky, Meic H. Schmidt, Thomas N. Scioscia, Gaetano Scuderi, Cyril T. Sebastian, Lee S. Segal, Rajiv K. Sethi, Suken A. Shah, Rishi N. Sheth, Khawar Siddique, Kern Singh, Paul D. Sponseller, Michael P. Steinmetz, David Stevens, Vincent C. Traynelis, Trent L. Tredway, Clifford B. Tribus, Eeric Truumees, Alexander R. Vaccaro, Kelly L. VanderHave, Brady T. Vibert, Frederick Vincent, Matthew H. Walker, David M. Wallach, Brian Walsh, Jeffrey C. Wang, Andrew P. White, Kirkham B. Wood, Howard B. Yeon, S. Tim Yoon, Jim A. Youssef

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6300cb3bd7eb40ec15d10ed3667330c2
https://doi.org/10.1016/b978-1-4160-3428-5.50006-5

Twin-GD: A New Twin Gated-Diode Measurement for the Interface Characterization of Ultra-Thin Gate Oxide MOSFET's with EOT Down to 1nm

Autor: C.T. Tsai, H.L. Meng, L.T. Hsu, Steve S. Chung, G.H. Ma, S.W. Sun, G.D. Lee, S.C. Chien, Yong-Fen Hsieh, H. Tai, C.W. Yang, W.M. Lin, L.W. Cheng, A.Y. Mao, K.T. Chu, C.R. Lee

Publikováno v: 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

In this paper, a new twin gated-diode (T-GD) method has been greatly improved for the oxide interface characterization of MOS devices with gate oxide as thin as 1 nm (EOT). With the scaling of gate oxide thickness into 1 nm regime, reported GD measur

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f162b512590057e745fe6b5e29555bfe
https://doi.org/10.1109/ipfa.2006.250992