Zobrazeno 1 - 10
of 157
pro vyhledávání: '"K.P. Rodbell"'
Publikováno v:
Materials Science and Engineering: A. 380:155-170
Crystallographic texture measurements were made on a series of rolled aluminum sheet specimens deformed in equi-biaxial tension up to a strain level of 0.11. The measurement techniques used were neutron diffraction with a 4-circle goniometer, electro
Publikováno v:
Microscopy Today. 10:5-9
Numerous microscopy techniques, based on both imaging and diffraction, exist for the measurement of grain size distributions in polycrystalline thin-film samples. The accuracy of each technique is affected by three major factors: the effective resolu
Autor:
K.P. Rodbell
Publikováno v:
Microelectronics Reliability. 32:1521-1526
Electromigration behavior and the kinetics of intermetallic formation in fine lines of Al/Hf/Al, Al/Ti/Al and Ti/Al/Ti as a function of Cu and Pd solute additions have been measured. In Hf/Al films, a second higher temperature eutectic reaction occur
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 64:125-129
The SUNY Albany rastered microbeam has been used to investigate the effects of mechanical pretreatment on metal/metal interdiffusion kinetics. Gating on different regions of a RBS spectrum can be used to create “diffusion maps” that reveal the la
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Publikováno v:
26th Annual Proceedings Reliability Physics Symposium 1988.
Experiments designed to compare conventional median-time-to-failure (MTF) data with those obtained through the use of noise measurements are reported. Comparisons are made of aluminum and aluminum-copper alloy films from identical wafers fabricated w
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 45:157-159
A computer program has been written to simulate the RBS spectrum from a sample consisting of many parallel three-layer stripes on a substrate (e.g. Al/Hf/Al stripes on SiO2). The simulated RBS spectrum depends on the thickness of the different layers
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 45:123-125
Al/M/Al stripes (with M = Hf, Ti or TiW) having widths from 0.5 to 200 μm were annealed in N2 and H2 gas. The interdiffusion between layers and hydrogen diffusion in from edges were studied by RBS and nuclear reaction analysis. For Hf and Ti syst
Publikováno v:
MRS Proceedings. 309
The Cu distribution in AI(Cu) thin films has been examined in blanket and patterned samples as a function of annealing. The Cu concentration in the Al grains, measured at room temperature, closely follows the solubility at the anneal temperature when