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pro vyhledávání: '"K.D. MuIler-GIaser"'
Publikováno v:
Proceedings of the IEEE Custom Integrated Circuits Conference.
This paper introduces a novel aRRroach for mauuing netn'mes to layout elements without using -layout-versus-;chimatic tools. Using this technique, a program has been developed that analyzes layouts, computes an observability degree for electron or la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::595b353f95e13ecfe782fe38f23c6843
https://doi.org/10.1109/cicc.1992.591326
https://doi.org/10.1109/cicc.1992.591326
