Zobrazeno 1 - 10
of 87
pro vyhledávání: '"K. Winslow"'
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-12 (2024)
Abstract For the past 15 years, the proportion of honey bee hives that fail to survive winter has averaged ~ 30% in the United States. Winter hive loss has significant negative impacts on agriculture, the economy, and ecosystems. Compared to other fa
Externí odkaz:
https://doaj.org/article/dcd7a86fe7ff44c1954371ab6fe3fc06
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Publikováno v:
Journal of Neurosurgical Sciences.
The aim of this study is to detail the neuropathologic changes resulting from the surgical placement of stereoelectroencephalography (SEEG) leads in an initial small group of epilepsy cases and to raise awareness of this iatrogenic pathology, especia
Autor:
Wen-Ching Liu, Nolan K. Winslow, Lisa Chao, Hrachya Nersesyan, Michael T. Zagardo, Patrick T. Tracy
Publikováno v:
Clinical neurology and neurosurgery. 219
Trigeminal neuralgia (TN) is a neuropathic pain syndrome that typically exhibits paroxysmal pain. However, the true mechanism of pain processing is unclear. We aim to evaluate the neural activity changes, before and after radiofrequency rhizotomy, in
Autor:
Brian F. White, R. Logan, Daniel J. Poindexter, Sholom M. Weiss, Amit Dhurandhar, Jonathan K. Winslow, Robert J. Baseman
Publikováno v:
Journal of Intelligent Manufacturing. 27:751-763
We describe methods for continual prediction of manufactured product quality prior to final testing. In our most expansive modeling approach, an estimated final characteristic of a product is updated after each manufacturing operation. Our initial ap
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Publikováno v:
Small Group Research. 38:509-531
A resource dilemma is a circumstance in which an aggregate of people share a slowly replenishing resource pool out of which each person can harvest for her or his own use. Successful management of a resource pool demands adequate leadership, but the
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 20:87-100
A method of communicating a unified pareto, we call "Grand Pareto," for technology-wide failure mechanisms that limit the profitability of a fabrication facility is presented. The Grand Pareto leverages multiple defect detection and isolation techniq
Publikováno v:
2012 SEMI Advanced Semiconductor Manufacturing Conference.
Minimizing circuit AC delay variations while maintaining power/performance is key for achieving high yielding products. The present work discusses an analytic model based approach for aligning the fundamental-FET electrical control and circuit-speed