Zobrazeno 1 - 4
of 4
pro vyhledávání: '"K. V. Kodandarama"'
Autor:
A. Vais, S. Yadav, Y. Mols, B. Vermeersch, K. V. Kodandarama, M. Baryshnikova, G. Mannaert, R. Alcotte, G. Boccardi, P. Wambacq, B. Parvais, R. Langer, B. Kunert, N. Collaert
Publikováno v:
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
Autor:
O. Syshchyk, Niamh Waldron, B. Hsu, E. Simoen, Nadine Collaert, Yves Mols, A. Vais, Bernardette Kunert, Hao Yu, K. V. Kodandarama, Alireza Alian
Publikováno v:
IRPS
We introduce a set of new characterization techniques for the direct defect analysis of the sidewall surfaces of Nano-ridge, Nanowire, and FinFET based devices, being used in current (and future) logic and RF technologies. We demonstrate the applicat
Autor:
Yu, Hao, Parvais, Bertrand, Zhao, Ming, Rodriguez, Raul, Peralagu, Uthayasankaran, Alian, Alireza, Collaert, Nadine
Publikováno v:
Applied Physics Letters; 5/23/2022, Vol. 120 Issue 21, p1-6, 6p
Autor:
Björn Debaillie, Philippe Ferrari, Didier Belot, François Brunier, Christophe Gaquiere, Pierre Busson, Urtė Steikūnienė
This book presents the latest research roadmaps and achievements from the European ecosystem (industry, research, and academia) driving the development of future wireless, wired, optical and satcom applications utilising the mm-wave and sub-THz bands