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Autor:
K. Sedlac˘ková, G. Abrasonis, U. Kreissig, Matthias Krause, W. Möller, A. Kolitsch, György Radnóczi, Arndt Mücklich
Publikováno v:
Carbon 45(2007)15, 2995-3006
Growth regimes of C:Ni (∼30 at.%) composite thin films grown by ion beam co-sputtering in the temperature range of RT-500 °C are investigated. The combination of elastic recoil detection analysis, X-ray diffraction, transmission electron microscop