Zobrazeno 1 - 7
of 7
pro vyhledávání: '"K. S. Ramaiah"'
Autor:
M. A. Reshchikov, K. Y. Lee, Feng Yun, C. Sone, Jacek B. Jasinski, Hadis Morkoç, Zuzanna Liliental-Weber, K. S. Ramaiah, Daming Huang, Sang-Yong Park
Publikováno v:
Journal of Materials Science: Materials in Electronics. 14:233-245
Structural and optical studies have been performed on GaN, InGaN layers, In0.08Ga0.92N/GaN heterostructures, In0.08Ga0.92N/In0.02Ga0.98N single and multiquantum wells grown by metal organic chemical vapor deposition (MOCVD) and GaN by molecular beam
Publikováno v:
Journal of Electroanalytical Chemistry. 436:49-52
Polycrystalline thin films of lead sulphide were electrodeposited on titanium, aluminium and stainless steel (SS) substrates at a constant potential of -0.7V vs. Ag\AgCl\(sat)KCl electrode using 1 mM solutions of Pb(NO,), and Na2S2O3 at pH2.7, 2.8 an
Autor:
Yan-Kuin Su, K. S. Ramaiah, F. S. Juang, Chin-Hsiang Chen, Shoou-Jinn Chang, H. P. Liu, In-Gann Chen
Publikováno v:
Applied Physics Letters. 85:401-403
InGaN(3nm)∕GaN(5nm) three period multiquantum green-light-emitting diodes (LEDs) grown by the metalorganic chemical vapor deposition technique have been studied using high-resolution transmission electron microscopy (HRTEM), double crystal high res
Publikováno v:
Applied Physics Letters. 84:3307-3309
The structural, surface morphology, and the temperature dependence photoluminescence of InGaN~ 3n m!/GaN~ 7n m! 5 period multi-quantum-well blue-light-emitting diode ~LED! structures grown by metal organic chemical vapor deposition ~MOCVD! have been
Autor:
L. He, Jiayu Chen, Faxian Xiu, Steve Puntigan, Hadis Morkoç, B. Pattada, K. S. Ramaiah, Qiaoying Zhou, M. O. Manasreh
Publikováno v:
Journal of Applied Physics. 93:10140-10142
Intersubband transitions in Si-doped molecular beam epitaxy grown GaN/AlGaN multiple quantum wells on c-plane sapphire were investigated using the Fourier-transform infrared optical absorption technique. Several GaN quantum well samples were grown wi
Publikováno v:
ChemInform. 29
Publikováno v:
Journal of Materials Science: Materials in Electronics; Apr2003, Vol. 14 Issue 4, p233-245, 13p