Mikroelektronik 87 : Berichte der Informationstagung ME 87

Autor: G. Hoffmann, D. Holzmann, F. Jäger, K. Riedling, G. H. Schwuttke, K. A. Pandelisev, R. C. White, H. Holzmann, W. Kausel, G. Nanz, S. Selberherr, H. Pötzl, H. Leopold, R. Röhrer, G. Winkler, M. Thurner, K. Seiner, W. Tritremmel, G. Walther, Erwin Schoitsch, S. Hertl, G. Schaffar, K. Schmidt, H. Steinbrecher, F. Voggenberger, W. Windischhofer, R. Turba, J. Grabner, H. Aberl, F. Seifert, F. Buschbeck, K. Wallisch, Ch. Eichtinger, P. Wach, W. Bittinger, A. Kainz, M. Jestl, W. Beinstingl, K. Berthold, A. Köck, E. Gornik, G. Kloiber, F. Kreid, K. P. Schröcker, M. Schrödl, E. Brazda, G. Niedrist, K. Dietz, P. Fey, S. Frenkenberger, M. Furtner, B. Dejneka, A. Goiser, M. Sust, M. Kowatsch, Ch. Jorde, G. G. Thallinger, E. Mothwurf, E. Schubert, J. Steger, E. Trzeba, I. Awramow, R. Pucher, L. M. Auer, S. Schuy, H. Schima, L. Huber, A. Prodinger, H. Schmallegger, H. Thoma, H. Stöhr, W. Mayr, R. Steiner, O. Wiedenbauer, G. List, G. Wießpeiner, Th. Petsch, G. Doblhoff, D. Kirchner, O. Koudelka, A. Gierlinger, A. Ullrich, B. Braune, H. Horvat, U. Mayer, A. Gauby, A. Richter, K. R. Spie

Im Tagungsband zur Informationstagung'Mikroelektronik 87'werden die in Form von Kurzvorträgen und Posters dargebotenen Beiträge in übersichtlicher Form präsentiert und geben einen guten Überblick über den aktuellen Forschungs- und Wissensstand

Micro-technology of densely spaced non-conventional patterns for space applications

Autor: G. Stangl, F. Rüdenauer, Peter Hudek, Ivan Kostic, W. Fallmann, Ivo W. Rangelow, K. Riedling

Publikováno v: Scopus-Elsevier

Regular arrays of sub-0.5 μm tips are of increasing interest, for example, as field emitters, calibration structures, or, in our particular case, as collector surfaces for sub-μm dust particles in a space experiment. This contribution describes the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e14df52e6bad39a9e203fdd90695ce5
https://doi.org/10.1016/s0167-9317(98)00042-2

A nonlinear simulation model of integrated Hall devices in CMOS silicon technology

Autor: K. Riedling, J. Schweda

Publikováno v: Proceedings of the 2002 IEEE International Workshop on Behavioral Modeling and Simulation, 2002. BMAS 2002..

A new simulation model for Hall devices in CMOS silicon technology is proposed. Nonlinearities caused by effects, as back-bias and vertical field-effect, transient effects caused by parasitics and wide operational range in temperature were taken into

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::48830a037f9d29a74db09de1339d8d98
https://doi.org/10.1109/bmas.2002.1291051

Cathode sputtered permalloy films of high AMR effect and low coercivity

Autor: G. Stangl, P. Aigner, Peter Hudek, R. Chabicovsky, J. Hochreiter, K. Riedling, H. Hauser, Ivan Kostic

Publikováno v: ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386).

The anisotropic magnetoresistive (AMR) effect of dc sputtered Ni 81%-Fe 19% films has been increased up to /spl Delta//spl rho///spl rho/=3.93% at 50 nm thickness. Investigations have been concentrated on the influence of the target current, the targ

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a69932ced5beae7e07fe6c7c96d6e2e7
https://doi.org/10.1109/asdam.2000.889471

Evaluation of adjustment data for simple ellipsometers

Autor: K. Riedling

Publikováno v: Thin Solid Films. 61:335-340

A method for improving the accuracy of simple ellipsometers of the fixed retarder and fixed angle of incidence type is presented. All the appratus parameters affecting measurement accuracy—the retarder characteristics, the azimuthal alignment of th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bf864fd4bfd341196a491ffbc8a1a098
https://doi.org/10.1016/0040-6090(79)90478-4