Zobrazeno 1 - 10
of 48
pro vyhledávání: '"K. Penanen"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Journal of Low Temperature Physics. 135:177-202
We present results of a study of third sound in thick 4He films in circular resonator geometry. Frequency and line shapes of third sound resonances are measured for temperatures between 0.3 and 2.1 K in saturated films approximately 30 nm thick. From
Publikováno v:
Journal of Low Temperature Physics. 134:1069-1077
We have performed measurements of third sound attenuation in thick films of superfluid 4He in the presence of small amounts of 3He. The attenuation due to 3He appears to depend linearly on the number density of 3He atoms in the film. We discuss the r
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 278:012006
The Cryocooler for the Mid Infrared Instrument (MIRI) on the James Webb Space Telescope (JWST) provides cooling at 6.2K on the instrument interface. The cooler system design has been incrementally documented in previous publications [1][2][3][4][5].
Autor:
Richard E. Packard, K. Penanen
Publikováno v:
Journal of Low Temperature Physics. 128:25-35
Third sound attenuation in thick 4He films has been observed to be much greater than predictions based on known mechanisms. We propose a possible mechanism for this observed high attenuation. Pinned vortices, possibly created when the superfluid tran
Publikováno v:
Physical Review B. 62:9641-9647
Films of isotopic mixtures of helium have been studied using x-ray specular reflectivity techniques. In contrast with superfluid ${}^{4}\mathrm{He}$ films, x-ray exposure causes a reduction in the thickness of ${}^{4}\mathrm{He}$ films above the supe
Publikováno v:
Physical Review B. 62:9621-9640
The free surface of thin films of liquid helium adsorbed on a solid substrate has been studied using x-ray reflectivity. The film thickness and interfacial profile are extracted from the angular dependence of measured interference between signals ref
Autor:
E. H. Kawamoto, Peter S. Pershan, Ben Ocko, K. Penanen, Moshe Deutsch, Sangyoub Lee, N. Maskil, Olaf M. Magnussen, M. J. Regan, Lonny E. Berman
Publikováno v:
Journal of Non-Crystalline Solids. :762-766
Surface-induced layering has been observed in liquid gallium and mercury using X-ray reflectivity. The specular reflectivity R(q z ) has been measured to wavevector transfers as large as q z = 3.0 A −1 . For Ga, the only major deviations from Fresn