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pro vyhledávání: '"K. Oota"'
Akademický článek
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Akademický článek
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Akademický článek
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Autor:
I. Aida, Hoyu Takahashi, Tadahiro Nakajima, T. Ikeda, Hajime Tanaka, Tetsutaro Ozawa, Y. Yonemochi, Yuki Toyoshima, H. Endo, Akiyoshi Kakita, M. Takahara, M. Tobinaga, K. Oota
Publikováno v:
Journal of the Neurological Sciences. 381:971-972
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9259cf73d295c6cb08bab10479a87d75
https://doi.org/10.1016/j.jns.2017.08.2737
https://doi.org/10.1016/j.jns.2017.08.2737
Autor:
H. Nakayasu, K. Oota, H. Yano, Hisanori Kowa, T. Kai, E. Awaki, Kenji Nakashima, M. Shimoda, Masayoshi Kusumi, K. Suzuki, Kenji Wada-Isoe
Publikováno v:
European Journal of Neurology. 15:1075-1079
Background and purpose: To conduct an epidemiological survey of acute encephalitis focusing on non-herpetic acute limbic encephalitis (NHALE) in Tottori Prefecture, western area of Japan. Methods: A questionnaire survey on the annual number of patien
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6160b6f8ac9821a676e24414092cbcaf
https://doi.org/10.1111/j.1468-1331.2008.02249.x
https://doi.org/10.1111/j.1468-1331.2008.02249.x
Autor:
Yuuki Honda, Kohei Wakabayashi, Toshi Hashimoto, Fuyuki Asano, Daisuke Wakatsuki, T. Takeshi, Tokutada Sato, Keisuke Kawachi, Youichi Takeyama, Mio Ebato, Hisa Shimojima, K. Oota, Yuukei Higashi
Publikováno v:
Journal of Interventional Cardiac Electrophysiology. 15:15-20
Introduction: Intra-cardiac echocardiography (ICE) which has some benefits, can be used to obtain detailed anatomy of the heart chambers or large vessels, and the catheter positions, and it has been considered useful for improving the outcome of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::771ae85f41fca33cf53de33f9d630848
https://doi.org/10.1007/s10840-006-7624-9
https://doi.org/10.1007/s10840-006-7624-9
Publikováno v:
IEEE Transactions on Components and Packaging Technologies. 25:164-168
The plastic ball grid array (BGA) package has poor resistance to popcorn cracking, which occurs when high temperatures involved in soldering cause water vapor to expand rapidly. Popcorn cracking occurs at die attach paste, and therefore water absorpt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ef6564563745915a41d5a2cd617d71d
https://doi.org/10.1109/6144.991189
https://doi.org/10.1109/6144.991189
Autor:
H. Kanaya, M. Takahara, H. Endo, Izumi Aida, Takashi Nakajima, Y. Yonemochi, M. Tobinaga, M. Miyoshi, Tetsuo Ozawa, T. Ikeda, K. Oota
Publikováno v:
Journal of the Neurological Sciences. 381:265
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d4f72bf2bedff500fe523c6f063ace6
https://doi.org/10.1016/j.jns.2017.08.756
https://doi.org/10.1016/j.jns.2017.08.756
Autor:
K, Wada-Isoe, M, Kusumi, T, Kai, E, Awaki, M, Shimoda, H, Yano, K, Suzuki, H, Nakayasu, K, Oota, H, Kowa, K, Nakashima
Publikováno v:
European journal of neurology. 15(10)
To conduct an epidemiological survey of acute encephalitis focusing on non-herpetic acute limbic encephalitis (NHALE) in Tottori Prefecture, western area of Japan.A questionnaire survey on the annual number of patients aged 16 years or more with acut
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::4494738d75f095b80a2c70b977fa8978
https://pubmed.ncbi.nlm.nih.gov/18717727
https://pubmed.ncbi.nlm.nih.gov/18717727
Autor:
A. Oishi, M. Kido, Ryota Katsumata, K. Ohno, Y. Okayama, K. Oota, M. Saito, Y. Takegawa, R. Hasumi, T. Yokoyama, Naoki Nagashima, Y. Morimasa, M. Iwai, Y. Sogo, T. Komoda, T. Sanuki, T. Komoguchi, M. Tamura, Hisao Yoshimura, T. Noguchi, Takashi Kinoshita, K. Kasai, Hideaki Aochi, K. Hiyama, Fumiyoshi Matsuoka, K. Fukasaku, T. Matsumoto, Hiroyasu Tanaka, Y. Okamoto
Publikováno v:
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
For the first time, a deep trench based embedded DRAM cell for 45nm node system on a chip (SoC) applications is presented. We achieve both high data retention time and full compatibility with logic process, while scaling eDRAM cell down to 0.069/spl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c51e3b99b539d28db9de8e62daaef363
https://doi.org/10.1109/.2005.1469193
https://doi.org/10.1109/.2005.1469193